研究目的
Investigating the effect of lens-to-sample distance (LTSD) on the quantitative analysis of steel by laser-induced breakdown spectroscopy (LIBS).
研究成果
The study demonstrates that the lens-to-sample distance significantly affects the quantitative analysis of steel by LIBS. The optimal LTSD for quantitative analysis should consider both the intensity of the analytical line and the background noise. The detection sensitivity and LOD vary with LTSD, indicating the importance of optimizing the laser focusing position for accurate quantitative analysis.
研究不足
The study focuses on the effect of LTSD on the quantitative analysis of steel by LIBS. The results may not be directly applicable to other materials or under different experimental conditions.
1:Experimental Design and Method Selection:
The study uses six standard alloy steels as samples to quantitatively analyze trace elements Si, Mn, and Cr by internal standard method. The effect of LTSD on spectral line intensity, background noise intensity, SBR, detecting sensitivity, and LOD was investigated.
2:Sample Selection and Data Sources:
Six standard alloy steel certified samples were used for quantitative analysis.
3:List of Experimental Equipment and Materials:
A Q-switched Nd:YAG laser, a plano-convex lens with a 100-mm focal length, an UV-NIR light collector, an Echelle spectrometer equipped with an ICCD detector, a Hg-Ar standard light source for wavelength calibration, a radiometric calibration source, and a delay generator.
4:Experimental Procedures and Operational Workflow:
The LTSD was varied from 86mm to 105mm with a step of 1mm. Before spectral collection, 20 laser pulses were performed to clean the sample surface. Each spectrum was accumulated for 50 laser pulses.
5:Data Analysis Methods:
The internal standard method was used for quantitative analysis. The calibration curves of the elements of interest were obtained by drawing the relative intensities of the specific emission lines against their certified concentrations.
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Echelle spectrometer
Mechelle 5000
Andor technology
Detecting the plasma emission
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ICCD detector
iStar DH334
Andor technology
Detecting the plasma emission
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Radiometric calibration source
DH-2000-CAL
Ocean Optics
Calibrating the spectral intensity
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Delay generator
DG645
SRS
Controlling the delay time between the laser and ICCD
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Q-switched Nd:YAG laser
Beamtech Optronics Co., Ltd.
Ablation laser for generating laser-induced plasma
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Plano-convex lens
Focusing the laser beam onto the sample surface
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UV-NIR light collector
Andor technology
Coupling the whole plasma emission into the fibre
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Hg-Ar standard light source
Andor technology
Wavelength calibration of the spectrometer
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