摘要： A critical impediment to the adoption and sustained deployment of crystalline silicon photovoltaic modules (c-Si PVMs) in the tropical climate is the accelerated degradation of their interconnections. At 40.7% c-Si PVM interconnect failure rate worldwide and significantly higher in the tropics. A review of impact of elevated ambient temperature operations on accelerated interconnection degradation is critical to achieving the system’s sustainability and reliability up to the 25-year design lifespan. This study reviews critical module’s operational parameters to advise on the future facing creation of robust module for the tropical region. Key areas reviewed include manufacturing process, solar cell efficiency, interconnection technology and R&D parameters. The review discusses the state-of-the-art in c-Si PVM interconnection technologies and propose back-junction-back-contact (BJ-BC) cell technology for adoption in the manufacture of the next generation of robust c-Si PVM for the tropics. The review findings provide insight into the future facing the robust c-Si PVM technology that is useful to the module design engineers.