研究目的
To synthesize uniform and very thin CsPbBr3 perovskite nanoplates (NPls) by introducing additional metal bromides and to understand their formation mechanism.
研究成果
The synthesis of CsPbBr3 NPls with a uniform thickness of 2 MLs was achieved by introducing FeBr3, leading to constrained growth and self-assembly. The NPls exhibited excellent optoelectronic properties, with a clear excitonic absorption peak and narrow emission. The formation mechanism was attributed to the substitution of surface Cs+ ions by protonated oleylammonium.
研究不足
The mechanism for generating certain 2ML NPls rather than other monolayers is still unclear. The yield decreases with increasing concentration of OLA-HBr, and the all-NPls product cannot be realized with too much OLA-HBr.
1：Experimental Design and Method Selection:
The synthesis involved the hot-injection method with the introduction of metal bromides to control the morphology of CsPbBr3 nanocrystals.
2：Sample Selection and Data Sources:
CsPbBr3 nanocrystals were synthesized with varying ratios of [FeBr3:PbBr2] to study the morphology evolution.
3：List of Experimental Equipment and Materials:
Materials included Cs2CO3, PbBr2, FeBr3, OA, OLA, ODE, and others. Equipment included TEM, XRD, UV-vis spectrophotometer, PL spectrophotometer, SAXS, AFM, XPS, and SEM.
4：Experimental Procedures and Operational Workflow:
The synthesis involved dissolving precursors, hot injection of Cs-oleate, and purification by centrifugation. Characterization was performed using various spectroscopic and microscopic techniques.
5：Data Analysis Methods:
Data were analyzed to understand the morphology, optical properties, and formation mechanism of the NPls.
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X-ray powder diffractometer
Bruker D8 Advance
Bruker
XRD measurements
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Spectrophotometer
UV-3600 PLUS
Shimadzu
UV-vis absorption spectra
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Fluorescence spectrophotometer
Hitachi F4600
Hitachi
PL emission spectra
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Small angle X-ray scattering
Anton Paar, SAXSess mc2
Anton Paar
SAXS measurements
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Atomic force microscope
Bruker Dimension Icon
Bruker
AFM topography images
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X-ray photoelectron spectroscopy
Thermo Scientific K-Alpha
Thermo Scientific
XPS test
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Field-emission scanning electron microscopy
Su-70
Hitachi
SEM graphs
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Transmission electron microscopy
JEOL JEM-2100
JEOL
Capturing TEM images of nanocrystals
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High angle annular dark field image - scanning transmission electron microscope
Talos F200 STEM
Talos
Capturing HAADF-STEM images and EDS mapping
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