研究目的
Fabrication of laser grade Yb: Y2O3 transparent ceramics with ZrO2 additive through hot isostatic pressing.
研究成果
The hot isostatic pressed 8 at.% Yb: Y2O3 transparent ceramics exhibit promising optical quality with a small average grain size and high transmittance in the near-infrared region. However, the presence of nano/micro-scaled pores and ZrO2 additive associated defects slightly compromise optical homogeneity and lead to unusual laser induced damage.
研究不足
The presence of nano/micro-scaled pores compromises optical homogeneity in the visible light region. Unusual laser induced damage is observed, related to ZrO2 additive associated defects.
1：Experimental Design and Method Selection:
The study involved the fabrication of 8 at.% Yb: Y2O3 transparent ceramics with ZrO2 as a sintering additive using hot isostatic pressing.
2：Sample Selection and Data Sources:
High purity raw powders of Y2O3 and Yb2O3 were used, mixed through ball milling, pressed into pellets, and treated with cold isostatic pressing before sintering.
3：List of Experimental Equipment and Materials:
Planetary ball mill machine, hardened stainless steel mold, hot isostatic press, UV-VIS-NIR spectrometer, scanning electron microscopy (SEM), polarized light microscopy.
4：Experimental Procedures and Operational Workflow:
The green bodies were pre-sintered, then subject to hot isostatic pressing, annealed, and polished for optical tests.
5：Data Analysis Methods:
Microstructure characterization, transmittance spectrum recording, and laser performance evaluation.
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获取完整内容-
Y2O3
99.999%
Jiahua Advanced Material Resources Co. Ltd, China
Raw material for fabricating transparent ceramics
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Yb2O3
99.995%
Jiahua Advanced Material Resources Co. Ltd, China
Raw material for fabricating transparent ceramics
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ZrO2
99.99%
Tosoh Co. Ltd, Japan
Sintering additive
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Planetary ball mill machine
Mixing raw powders
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Hardened stainless steel mold
Pressing powders into pellets
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Hot isostatic press
Sintering ceramic samples
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UV-VIS-NIR spectrometer
Cary 5000
Varian Co. Ltd., USA
Recording transmittance spectrum
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Scanning electron microscopy (SEM)
JSM-6340
JEOL Co. Ltd, Japan
Characterizing microstructure
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Polarized light microscopy
BX53
Olympus Co. Ltd., Japan
Examining optical homogeneity
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