研究目的
Investigating the fabrication of perovskite quantum dot light-emitting devices using inkjet printing technique for display applications.
研究成果
The study successfully demonstrated the fabrication of perovskite quantum dot matrix light-emitting devices using inkjet printing, achieving notable luminance and efficiency. The methods developed may facilitate the production of perovskite quantum dot displays, though further improvements in film quality and device stability are needed.
研究不足
The current efficiency of the matrix inkjet printing device was lower than that of spin-coating one, and the device lifetime was only 7 min at 90 cd m?2. Challenges include improving film quality and stability for long-term printing processes.
1:Experimental Design and Method Selection:
The study focused on obtaining a stable perovskite quantum dot ink and fabricating a matrix light-emitting device using inkjet printing. The method included the synthesis of FA
2:3Cs7PbBr3 perovskite quantum dots, purification with oleylamine, and formulation of an ink with octane:
dodecane cosolvent.
3:Sample Selection and Data Sources:
FA0.3Cs0.7PbBr3 perovskite quantum dots were synthesized in the lab. The ink's stability and film quality were assessed through storage tests and film morphology analysis.
4:3Cs7PbBr3 perovskite quantum dots were synthesized in the lab. The ink's stability and film quality were assessed through storage tests and film morphology analysis. List of Experimental Equipment and Materials:
3. List of Experimental Equipment and Materials: Instruments included a UV–visible spectrophotometer, photoluminescence spectrometer, X-ray diffractometer, TEM, and inkjet printing setup. Materials included PEDOT:PSS, PVK, poly-TPD, and various chemicals for PeQD synthesis.
5:Experimental Procedures and Operational Workflow:
The process involved PeQD synthesis, ink formulation, device fabrication by inkjet printing, and performance evaluation.
6:Data Analysis Methods:
Device performance was analyzed using current density–voltage–luminance measurements, EL spectra, and efficiency calculations.
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X-ray diffractometer
Panalytical
Panalytical
Measuring X-ray diffraction (XRD) patterns
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Microscope
Veeco NT 9300
Veeco
Recording 3D morphology images
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Source meter
Keithley 2400
Keithley
Recording current density (J)–voltage (V)–luminance (L) characteristics
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UV–visible spectrophotometer
HP 8453E
HP
Recording UV–visible absorption spectra
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Photoluminescence spectrometer
Biaoqi Photoelectric
Biaoqi
Recording photoluminescent (PL) spectra
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TEM
TECNAI G2 20 LaB6
TECNAI
Collecting TEM images
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Luminance meter
Konica Minolta CS-200
Konica Minolta
Measuring luminance
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Photometer
PR-705
PR
Recording EL spectra
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