研究目的
To achieve high-performance perovskite light-emitting diodes (PeLEDs) through rational interface engineering for energy-efficient photon generation and enhanced light outcoupling.
研究成果
The study demonstrates a synergetic device architecture for high-efficiency flexible PeLEDs, achieving a record EQE of 24.5% through interface engineering for energy-efficient photon generation and enhanced light outcoupling. The approach provides an effective scheme for future flexible PeLEDs.
研究不足
The brittle nature of CsPbBr3 perovskite films may hinder mechanical flexibility under continuous bending stress, potentially causing cracks and device degradation.
1:Experimental Design and Method Selection:
The study involves the design of flexible PeLEDs with a focus on interface engineering to enhance crystallization and defect passivation of perovskite emitters.
2:Sample Selection and Data Sources:
CsPbBr3 perovskite films were used as emitters, with modifications to the underlying PEDOT:PSS layer using ethanolamine (ETA).
3:List of Experimental Equipment and Materials:
Materials include CsPbBr3 perovskite, PEDOT:PSS, ETA, silver nanowires (AgNWs), and ZnO. Equipment includes SEM, AFM, XRD, and spectrometers for optical and electrical characterization.
4:Experimental Procedures and Operational Workflow:
The process involves modifying PEDOT:PSS with ETA, depositing perovskite films, and fabricating PeLED devices with AgNWs/ZnO electrodes.
5:Data Analysis Methods:
Performance was evaluated through EQE, CE measurements, and transient EL/PL decays.
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AFM
Veeco Multimode V
Veeco
Characterization of surface morphologies in a tapping mode.
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XRD
PANalytical X’Pert Pro
PANalytical
Recording X-ray diffraction patterns of perovskite films.
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UV/vis/near-IR spectrometer
PerkinElmer Lambda 950
PerkinElmer
Recording optical absorption and transmission spectra.
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Fluorescence lifetime spectrometer
Quantaurus-Tau C11367-32
Hamamatsu Photonics
Measuring steady-state PL spectra and transient PL decays.
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Programmable power source
Keithley model 2400
Keithley
Measuring current density-voltage-luminance (J-V-L) characteristics.
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SEM
Zeiss Supra 55
Zeiss
Characterization of surface morphologies of various films.
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Four-probe tester
ST-2258A
Measuring sheet resistance of electrodes.
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Spectroscopic ellipsometry
alpha-SE
J. A. Woollam Corp
Measuring layer thickness, frequency-dependent refractive index (n), and extinction coefficient (k) values.
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Contact angle tester
DataPhysics instruments GmbH
Measuring contact angles.
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Luminance meter/spectrometer
PhotoResearch PR670
PhotoResearch
Measuring electroluminescence (EL) spectra.
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