研究目的
Investigating the enhancement of power conversion efficiency and stability of inverted perovskite solar cells through the incorporation of Bi2Te3 flakes as dopants in the electron transport layer and as a protective interlayer.
研究成果
The incorporation of Bi2Te3 flakes as dopants in the PC70BM ETL and as a protective interlayer significantly enhances both the efficiency and stability of inverted PSCs. The optimal doping level and interlayer thickness were identified, leading to a PCE of up to 19.46% and retaining more than 80% of the initial PCE over 1100 h under continuous illumination. These findings highlight the potential of Bi2Te3 flakes in improving the performance and longevity of PSCs.
研究不足
The study is limited by the potential negative impact of excessive exposure of the underlying layers to IPA:ACN solvent when the number of consecutive spin coatings exceeds two. Additionally, the scalability of the spin coating deposition method for large-scale applications may pose challenges.
1:Experimental Design and Method Selection:
The study implemented a two-fold engineering approach by incorporating Bi2Te3 flakes into inverted PSCs. The first approach involved doping the PC70BM-based ETL with Bi2Te3 flakes, and the second approach involved forming a protective interlayer above the ETL.
2:Sample Selection and Data Sources:
Bi2Te3 flakes were produced through liquid-phase exfoliation of the corresponding bulk crystal. The doping of the PC70BM solution with Bi2Te3 flake dispersion was varied between 0% to 3% v/v.
3:List of Experimental Equipment and Materials:
The study used a solar simulator for testing PSCs under inert atmosphere, TEM and AFM for morphological characterization, and Raman spectroscopy for structural properties evaluation.
4:Experimental Procedures and Operational Workflow:
The Bi2Te3 flakes were deposited onto PC70BM through consecutive spin coatings. The devices were then encapsulated and tested under continuous 1 Sun illumination.
5:Data Analysis Methods:
The performance of the PSCs was evaluated through J-V curves, EQE spectra, and transient transport measurements.
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JEM 1011 TEM
1011
JEOL
Transmission electron microscopy for morphological characterization
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Kratos Axis Ultra spectrometer
Axis Ultra
Kratos
Ultraviolet photoelectron spectroscopy for work function estimation
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FEI Helios Nanolab 450S
Helios Nanolab 450S
FEI
Scanning electron microscopy for device morphology analysis
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FEI Quanta 250 FEG
Quanta 250 FEG
FEI
SEM-EDS measurements for device analysis
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Branson 5800 cleaner
5800
Branson ultrasonics
Ultrasonication bath for material exfoliation
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Sigma 3-16P centrifuge
3-16P
Sigma
Ultracentrifugation for material separation
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PIPETMAN L P100L
P100L
Gilson
Precision pipetting for supernatant collection
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XE-100 AFM
XE-100
Park System
Atomic force microscopy for thickness distribution analysis
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Renishaw microRaman Invia 1000
Invia 1000
Renishaw
Raman spectroscopy for structural properties evaluation
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Cary Varian 5000 UV?vis spectrometer
5000
Varian
Optical absorption spectroscopy for material characterization
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Oriel solar simulator
Oriel
ABB
Solar simulator for PSC testing under inert atmosphere
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QE-T system
QE-T
Enlitech
External quantum efficiency spectra recording
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