研究目的
To investigate the influence of the morphological properties, crystallite size and roughness, on the reversible specific charge capacity and the respective optical responses of V2O5 thin films.
研究成果
The optimization of the opto-electrochemical properties of V2O5 thin films can be achieved by decreasing the size of its crystallites and increasing their roughness, optimizing and increasing the efficiency on the light control processes.
研究不足
The study focuses on the influence of morphological properties on opto-electrochemical performance but does not explore the effects of other variables such as deposition temperature or pressure in detail.
1：Experimental Design and Method Selection:
Vanadium oxide thin films were deposited by resistive thermal evaporation under high vacuum. The films morphological properties were modified by varying their thickness to the nanoscale.
2：Sample Selection and Data Sources:
Glass plates covered with ITO were used as substrates. The films were thermally treated in an oxidizing atmosphere.
3：List of Experimental Equipment and Materials:
A portable X-ray fluorescence system (PXRF) for thickness measurement, atomic force microscopy (AFM) for surface roughness, and X-ray diffraction (XRD) for crystallite size measurement.
4：Experimental Procedures and Operational Workflow:
The films were deposited by thermal evaporation, followed by heat treatment. Morphological and structural properties were analyzed by AFM and XRD.
5：Data Analysis Methods:
The crystallite size was calculated using Scherrer equation from XRD data. The surface roughness was obtained by AFM images analysis.
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