研究目的
Investigating the fabrication and characterization of earth abundant CuZnS ternary thin films by vacuum spray pyrolysis and the fabrication of p-CZS/n-AZO heterojunction solar cells.
研究成果
The study successfully fabricated and characterized CZS thin films using vacuum spray pyrolysis, demonstrating their potential as absorber layers in solar cells. The fabricated p-CZS/n-AZO heterojunction solar cell achieved a conversion efficiency of 1.6 ± 0.05%, indicating that CZS is a promising material for cost-effective and non-toxic solar PV devices.
研究不足
The study is limited by the specific conditions of the spray pyrolysis technique used, such as substrate temperature and vacuum pressure, which may affect the reproducibility and scalability of the results. Additionally, the efficiency of the fabricated solar cells is relatively low compared to mainstream technologies.
1：Experimental Design and Method Selection:
The study employed chemical spray pyrolysis technique under vacuum for the deposition of CZS thin films at different substrate temperatures.
2：Sample Selection and Data Sources:
Ultra-sonically cleaned soda lime glass slides were used as substrates. The precursor solution consisted of Copper Chloride, Zinc Chloride, and Thiourea.
3：List of Experimental Equipment and Materials:
Equipment included a spray pyrolysis setup, peristaltic pump, PID controlled heater, and characterization tools like X-Ray Diffractometer, Raman Spectrometer, FESEM, AFM, XPS, UPS, UV-Vis-NIR Spectrophotometer, and Hall measurement system.
4：Experimental Procedures and Operational Workflow:
The precursor solution was sprayed onto substrates at temperatures of 300°C, 350°C, and 400°C under a vacuum environment. The films were then characterized for structural, morphological, optical, compositional, and electrical properties.
5：Data Analysis Methods:
Data from various characterizations were analyzed to determine crystallite size, band gap, work function, carrier concentration, and solar cell efficiency.
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X-Ray Diffractometer
RIGAKU Ultima Smart Lab
RIGAKU
Structural studies of thin films
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Field Emission Scanning Electron Microscopy
ZEISS Ultra 55
ZEISS
Surface morphology analysis
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X-ray Photoelectron Spectroscopy
Kratos-Axis Ultra DLD
Kratos
Chemical composition determination
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UV-Vis-NIR Spectrophotometer
JASCO V-670
JASCO
Optical characterization
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Source measure unit
Keysight-B2901A
Keysight
I-V measurements
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Raman Spectrometer
Horiba LabRAM HR Evolution
Horiba
Raman measurement
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Atomic Force Microscopy
Park-NX10
Park
Surface topography and roughness analysis
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Ultraviolet Photoelectron Spectroscopy
Work function determination
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Hall measurement system
ECOPIA -HMS 5000
ECOPIA
Carrier concentration, conductivity, mobility and carrier type measurement
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