研究目的
Investigating the tuning of surface ions on Cd(OH)2@ZnO nanowires thin-film based on the gas discharge induced by a triboelectric nanogenerator (TENG) and its application in developing thin-film transistor (TFT) and thin-film photodetector (TFP) with enhanced performances.
研究成果
The TENG-based SIG technology enables the development of novel electronic and optoelectronic nanodevices with enhanced performances, such as high on-off ratio and fast recovery speed, by modulating surface ions on semiconductor nanostructures.
研究不足
The study is limited by the non-volatile nature of O2- ions in air, requiring UV illumination for reversible modulation. The adsorption rate of O2- ions is influenced by surface characteristics and environmental conditions.
1:Experimental Design and Method Selection:
The study utilizes a TENG to induce gas discharge for tuning surface ions on Cd(OH)2@ZnO nanowires thin-film. The nanowires are synthesized via hydrothermal method and atomic-layer-deposition (ALD) technique.
2:Sample Selection and Data Sources:
Cd(OH)2@ZnO core-shell nanowires thin-film devices are prepared with varying ALD growing cycles of ZnO shell.
3:List of Experimental Equipment and Materials:
Includes a TENG, full-wave rectifier bridge, tungsten discharge needle, and nanowires thin-film device.
4:Experimental Procedures and Operational Workflow:
The SIG modulation involves TENG operation cycles to adsorb O2- ions on nanowires surface, acting as a floating gate. UV light is used for 'erase' operation.
5:Data Analysis Methods:
Electrical properties are measured using a Keithley 4200-SCS semiconductor characterization system, and photocurrent sensitivity, UV gain, and time constant are calculated.
独家科研数据包,助您复现前沿成果,加速创新突破
获取完整内容-
Keithley 4200-SCS
4200-SCS
Keithley
Semiconductor characterization system for measuring electrical properties.
-
Keithley 6514
6514
Keithley
Electrometer for measuring the quantity of charges.
暂无现货
预约到货通知
-
LED UV light source
M365FP1
Thorlabs, Inc.
UV light source with a center wavelength of 365 nm for illumination.
-
SEM microscope
NOVA-450
FEI
Scanning-electron-microscopy for imaging nanowires thin-film.
暂无现货
预约到货通知
-
ALD system
Picosun-R200
Picosun
Atomic-layer-deposition system for growing ZnO shells on Cd(OH)2 nanowires.
暂无现货
预约到货通知
-
Cryogenic probe station
CRX-VF
Lake Shore Cryogenics
For measuring I-V curves at different temperatures.
暂无现货
预约到货通知
-
登录查看剩余4件设备及参数对照表
查看全部