研究目的
To propose a non-destructive, automated procedure for extracting the I-V characteristics of individual cells in fully encapsulated photovoltaic modules, enabling the identification and extraction of electrical parameters of underperforming cells due to defects or degradation.
研究成果
The proposed methodology provides a lean and accurate procedure for extracting I-V curves of individual cells in PV modules, capable of identifying underperforming cells due to defects or degradation. It has been validated for noise robustness, flexibility in terms of cell non-uniformities, and scalability towards larger systems. The approach can be utilized for automated quality assurance, fault assessment, and investigation of degradation mechanisms in PV modules.
研究不足
The methodology requires controlled shading of individual cells, which may be challenging to implement in practice without specialized equipment. Additionally, the computational complexity increases with the number of cells in the module.
1：Experimental Design and Method Selection:
The approach uses multiple I-V measurements on the PV module with specific levels of shading on individual cells. The single circuit models for the cells are obtained through the solution of an inverse fitting problem.
2：Sample Selection and Data Sources:
The methodology assumes measurements that can be performed at a module level, with each cell individually shaded to several well-defined irradiance levels.
3：List of Experimental Equipment and Materials:
PV modules, shading equipment for controlled irradiance levels, I-V curve measurement setup.
4：Experimental Procedures and Operational Workflow:
I-V curves are measured at module level under variable shading conditions. A model identification problem is formulated as a large least-squares inverse problem.
5：Data Analysis Methods:
The electrical characteristics of the cells are found by identifying the parameters of their equivalent circuit model using advanced model identification techniques.
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