研究目的
Investigating the pixel-to-pixel variation on a calibrated PILATUS3-based multi-energy soft x-ray detector to measure plasma x-ray emissivity in multiple energy ranges with a unique combination of spatial and spectral resolution.
研究成果
The ME-SXR diagnostic at MST, based on the PILATUS3 detector, has been calibrated to sample the x-ray spectrum of the plasma using multiple energy thresholds either between 1.6 and 6 keV or between 4 and 14 keV. The variation in the calibration across all pixels was characterized, with a standard deviation of 2–4 trimbits for a specified Ec. The requirement that the trimbit setting must be an integer resulted in a pixel-to-pixel threshold deviation of ?E < 100 eV for the 1.6–6 keV calibration and ?E < 200 eV for the 4–14 keV calibration.
研究不足
The discreteness of trimbit settings results in an effective threshold resolution of ?E < 100 eV for the 1.6–6 keV range and ?E < 200 eV for the 4–14 keV range. The calibration uncertainty is comparable to or smaller than the threshold variation due to rounding.
1:Experimental Design and Method Selection:
The detector was calibrated by scanning individual trimbit settings while exposed to fluorescence emission from various targets. The data were fit to a characteristic "S-curve" to determine the mapping between trimbit settings and photon cutoff energy threshold for each pixel.
2:Sample Selection and Data Sources:
Fluorescence emission from Ag, In, Mo, Ti, V, and Zr targets was used for the 1.6–6 keV range, and Cr, Fe, Cu, Ge, and Br sources for the 4–14 keV range.
3:6–6 keV range, and Cr, Fe, Cu, Ge, and Br sources for the 4–14 keV range.
List of Experimental Equipment and Materials:
3. List of Experimental Equipment and Materials: PILATUS3 100k x-ray detector, fluorescence targets (Ag, In, Mo, Ti, V, Zr, Cr, Fe, Cu, Ge, Br).
4:Experimental Procedures and Operational Workflow:
The detector was exposed to a nearly uniform x-ray source generated by fluorescence. Exposures were taken with each pixel's trimbit value set from 0 to 63, and the data were fit to an S-curve.
5:Data Analysis Methods:
Nonlinear fit of the trimbit scan data to an S-curve equation to determine the mapping between trimbit setting and photon cutoff energy threshold for each pixel.
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