研究目的
The study of low frequency dielectric relaxation and charge transport processes in Bi12TiO20 photorefractive sillenite crystals.
研究成果
The dispersion of dielectric permittivity ε' in Bi12TiO20 crystals grows with lowering frequency and rising temperature, related to dipole-relaxation polarization mechanisms. The frequency dependence of dielectric loss tgδ reveals relaxation peaks, and the charge transport is a thermally activated process with activation energy Ea = (0.82±0.03) eV.
研究不足
The study is limited to low frequency range (10-2 to 104 Hz) and a temperature range from 273K to 323K. The measurement error of electrical quantities did not exceed 5%.
1：Experimental Design and Method Selection:
The study involved measuring the dielectric spectrum of Bi12TiO20 crystals in a wide temperature range using a 'Concept 81' spectrometer by NOVOCONTROL Technologies GmbH & Co. in a frequency range of 10-2 to 104 Hz and a temperature range from 273K to 323K.
2：3K. Sample Selection and Data Sources:
2. Sample Selection and Data Sources: Crystal samples were prepared in the form of discs
3：0 mm in diameter and 00 mm thick, with silver paste applied to both sides for electrical measurements. List of Experimental Equipment and Materials:
'Concept 81' spectrometer, scanning electron microscope (SEM) Carl Zeiss EVO
4：Experimental Procedures and Operational Workflow:
The dielectric spectrum was measured with a voltage of
5：0 V, with temperature stabilization accuracy of ±3 °С. The composition of elements in samples was studied using SEM. Data Analysis Methods:
The frequency dependence of dielectric permittivity ε' and dielectric loss tgδ were analyzed, along with the Cole-Cole diagram and the real part of complex conductivity.
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