研究目的
To enhance the photocatalytic hydrogen evolution rate of graphitic carbon nitride (g-C3N4) through simultaneous K-doping and exfoliation.
研究成果
The simultaneous K-doping and exfoliation of g-C3N4 significantly enhance its photocatalytic hydrogen evolution rate, attributed to increased surface area, optimized photoreduction potential, and improved charge generation and separation. This method offers a promising pathway for developing efficient g-C3N4-based photocatalysts.
研究不足
The study focuses on the enhancement of photocatalytic hydrogen evolution rate through K-doping and exfoliation, but the scalability and cost-effectiveness of the synthesis method for large-scale applications are not discussed.
1:Experimental Design and Method Selection:
A KOH-assisted hydrothermal-reformed melamine strategy was used to achieve simultaneous K-doping and exfoliation of g-C3N
2:Sample Selection and Data Sources:
Melamine (MA) and KOH were used as precursors.
3:List of Experimental Equipment and Materials:
Teflon-lined autoclave, Bruker D8 Advance X-ray diffractometer, Bruker Tensor 27 Spectrometer, Thermo ESCALAB Xi + instrument, JEOL (JEM-2100) TEM, JEOL (JSM-7000F) SEM, Atomic force microscopy (AFM, Dimension, Bruker), Micromeritics ASAP 2000 plus analyzer, UV/vis/NIR spectrophotometer (Hitachi U-4100), Fluorescence spectrophotometer (FluoroLog-3, HORIBA, Jobin Yvon), Shanghai Chenhua electrochemical system (CHI660E), Gas chromatographer (GC7920, TCD).
4:Experimental Procedures and Operational Workflow:
The mixture of MA, KOH, and deionized water was sonicated, sealed in a Teflon-lined autoclave, and maintained at 180°C for 12 h. The obtained solids were washed, dried, and calcined at 550°C for 2 h.
5:Data Analysis Methods:
XRD, FTIR, XPS, TEM, SEM, AFM, N2 adsorption-desorption analyses, DRS, PL emission spectra, photoelectrochemical test.
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JEOL (JEM-2100) TEM
JEM-2100
JEOL
Characterizing transmission electron microscopy images
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JEOL (JSM-7000F) SEM
JSM-7000F
JEOL
Characterizing scanning electron microscopy images
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Atomic force microscopy (AFM, Dimension, Bruker)
Dimension
Bruker
Evaluating the thickness of obtained samples
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UV/vis/NIR spectrophotometer (Hitachi U-4100)
U-4100
Hitachi
Measuring diffuse reflection spectra
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Bruker D8 Advance X-ray diffractometer
D8 Advance
Bruker
Measuring powder X-ray diffraction patterns
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Bruker Tensor 27 Spectrometer
Tensor 27
Bruker
Collecting Fourier transform infrared spectra
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Thermo ESCALAB Xi + instrument
ESCALAB Xi +
Thermo
Obtaining X-ray photoelectron spectroscopy data
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Micromeritics ASAP 2000 plus analyzer
ASAP 2000 plus
Micromeritics
Carrying out N2 adsorption-desorption analyses
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Fluorescence spectrophotometer (FluoroLog-3, HORIBA, Jobin Yvon)
FluoroLog-3
HORIBA, Jobin Yvon
Recording room temperature fluorescence emission spectra
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Shanghai Chenhua electrochemical system (CHI660E)
CHI660E
Shanghai Chenhua
Carrying out photoelectrochemical measurements
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Gas chromatographer (GC7920, TCD, Beijing China Education Au-light Co., Ltd., China)
GC7920
Beijing China Education Au-light Co., Ltd.
Analyzing the amount of hydrogen evolution
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