研究目的
To measure the silicon lattice parameter in the SI-unit of length by combined optical and x-ray scanning interferometry, enabling continuous data acquisition of x-ray interference fringes at increased scanning speeds.
研究成果
A new setup for measuring the lattice parameter of silicon in the SI-unit of length was presented. It is expected to contribute to the investigation of isotopically enriched 28Si crystals in the framework of the redefinition of the SI mass unit kg.
研究不足
The setup requires improvements to further reduce the instability of the translation device of the analyzer lamella, currently about 200 pm in a frequency range below 100 Hz.
1：Experimental Design and Method Selection:
Combined optical and x-ray scanning interferometry is used to measure the silicon lattice parameter. The method leverages single x-ray photon quantum beats for continuous data acquisition.
2：Sample Selection and Data Sources:
The experiment utilizes a high-purity float zone silicon crystal lattice.
3：List of Experimental Equipment and Materials:
Includes a high resolution optical interferometer, x-ray interferometer, and a vacuum chamber on a vibration isolated granite table.
4：Experimental Procedures and Operational Workflow:
The setup involves translating the analyzer lamella while simultaneously recording x-ray time channels and measuring the position with an optical interferometer.
5：Data Analysis Methods:
Fourier transform analysis of simulated time series to evaluate the contribution to the uncertainty of the silicon lattice parameter measurement.
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