研究目的
Investigating the use of spray plasma processing to deposit submicron organosilicate barrier films for improving the stability of flexible perovskite solar cells against environmental stressors.
研究成果
The spray plasma processing method successfully deposited submicron organosilicate barrier films that significantly improved the stability of perovskite solar cells against light, heat, and moisture. The films also demonstrated excellent mechanical flexibility, making them suitable for flexible electronic devices. The incorporation of a fluorine-based precursor improved the films' morphology and density, further enhancing their protective properties.
研究不足
The study focused on the stability improvements of perovskite solar cells with the deposited barrier films but did not extensively explore the long-term durability under continuous operational conditions or the scalability of the process to industrial levels.
1：Experimental Design and Method Selection:
The study utilized rapid spray plasma processing (RSPP) to deposit organosilicate barrier films in ambient conditions. The method was chosen for its scalability and compatibility with flexible substrates.
2：Sample Selection and Data Sources:
Perovskite solar cells were used as the substrate for barrier film deposition. The films' properties were characterized using cross-sectional SEM, X-ray diffraction, and water contact angle measurements.
3：List of Experimental Equipment and Materials:
An atmospheric pressure plasma jet system (PlasmaTreat GmbH), an ultrasonic atomizing nozzle (AccuMist, Sono-Tek Corporation), and precursor solutions of hexamethyldisiloxane (HMDSO) and trifluorotoluene (TFT) were used.
4：Experimental Procedures and Operational Workflow:
The precursor solution was sprayed onto the devices in lab air, using an ultrasonic atomizing nozzle. The substrates were placed at a specific distance from the plasma nozzle, and the raster speed of the nozzles was kept constant.
5：Data Analysis Methods:
The morphology and density of the barrier films were analyzed using SEM. The stability of the films was assessed through bending tests and in situ X-ray diffraction measurements during heating.
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