研究目的
Investigating the anomalous Nernst response of Co2MnGa thin films and comparing it to a reference CoFeB thin film to understand its potential for spin-caloritronic devices.
研究成果
The study demonstrates that Co2MnGa thin films exhibit a large anomalous Nernst effect, making them promising candidates for spin-caloritronic devices. The effect is temperature-dependent and varies with film thickness, suggesting a complex microscopic origin involving skew-scattering, side-jump, or intrinsic Berry phase contributions.
研究不足
The study is limited to thin films of Co2MnGa and CoFeB, and the results may not be directly applicable to other materials or thicker films. The microscopic origin of the anomalous Nernst effect in Co2MnGa is complex and not fully understood.
1:Experimental Design and Method Selection:
The study involves the systematic measurement of the anomalous Nernst coefficient as a function of temperature in Co2MnGa thin films. The on-chip thermometry technique is used to quantify the thermal gradient.
2:Sample Selection and Data Sources:
Co2MnGa thin films of two different thicknesses (10 nm and 50 nm) and reference CoFeB thin films are used. The samples are characterized using X-ray diffraction and SQUID magnetometry.
3:List of Experimental Equipment and Materials:
A multisource Bestec UHV deposition system for film deposition, QD SQUID magnetometer for magnetization measurements, and Keithley 2182 nanovoltmeters for voltage detection.
4:Experimental Procedures and Operational Workflow:
The films are patterned into Hall bars, and a thermal gradient is applied in the sample plane. The anomalous Nernst voltage is measured as a function of the out-of-plane magnetic field.
5:Data Analysis Methods:
The anomalous Nernst coefficient is evaluated using the measured voltage and the quantified thermal gradient.
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