研究目的
To realize the universality of photocatalytic materials for unselective removing various organic pollutants in water by preparing a surface dual-doped Cu/Cl-g-C3N4 photocatalyst.
研究成果
The surface dual-doped Cu/Cl-g-C3N4 photocatalyst exhibits superior photocatalytic activity, stability, and recyclability for degrading various organic pollutants in water, attributed to extended visible light harvest range, elevated CB potential, and improved separation efficiency of charge carriers.
研究不足
The study focuses on the photocatalytic degradation of specific organic pollutants under visible light. The scalability and practical application in real water treatment scenarios are not extensively discussed.
1：Experimental Design and Method Selection
The study involves the preparation of a surface dual-doped Cu/Cl-g-C3N4 photocatalyst and its comparison with pure g-C3N4 for degrading various organic pollutants under visible light.
2：Sample Selection and Data Sources
Samples include pure g-C3N4 and Cu/Cl-g-C3N4 with different doping ratios. Data sources include XRD, FT-IR, UV-vis DRS, FESEM, TEM, PL spectra, XPS, and HPLC-MS.
3：List of Experimental Equipment and Materials
Equipment includes D/MAX-2500 diffractometer, Bruker Vertex 70 spectrometer, UV-vis-NIR spectrophotometer, S-128 4800 FESEM, Tenai G2 F30 S-Twin TEM, Horiba JobinYvon luminescence spectrometer, Thermo ESCALAB 250X electron spectrometer, NOVA 2200e surface area analyzer, HPLC-MS system, multi N/C 2100 TOC analyzer, CHI 660C electrochemical workstation, and Bruker EPR A300-10/12 spectrometer. Materials include CuCl, ammonia water, ethanol absolute, urea, and tetracycline hydrochloride.
4：Experimental Procedures and Operational Workflow
Preparation of Cu/Cl-g-C3N4 involves drying urea, calcining, washing, and doping with CuCl. Photocatalytic degradation experiments are performed under visible light with various organic pollutants.
5：Data Analysis Methods
Data analysis includes XRD pattern analysis, FT-IR spectrum analysis, UV-vis DRS analysis, PL and TR-PL spectra analysis, XPS analysis, and HPLC-MS analysis for intermediate products.
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S-128 4800 field emission scanning electron microscope
S-128 4800
Hitachi
Used for observing the morphology of samples.
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Thermo ESCALAB 250X electron spectrometer
ESCALAB 250X
Thermo
Used for obtaining X-ray photoelectron spectroscopy (XPS).
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multi N/C 2100 TOC analyzer
multi N/C 2100
Analytik Jena AG
Used for measuring total organic carbons (TOC).
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Bruker EPR A300-10/12 spectrometer
EPR A300-10/12
Bruker
Used for electron spin resonance (ESR) analysis.
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D/MAX-2500 diffractometer
D/MAX-2500
Rigaku
Used for obtaining powder X-ray diffraction (XRD) patterns of samples.
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Bruker Vertex 70 spectrometer
Vertex 70
Bruker
Used for recording the Fourier transform infrared (FT-IR) spectra.
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UV-vis-NIR spectrophotometer
Cary 5000
Varian
Used for obtaining UV-vis diffuse reflectance spectra (UV-vis DRS).
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Tenai G2 F30 S-Twin TEM
G2 F30 S-Twin
Tenai
Used for characterizing the microstructure of samples.
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Horiba JobinYvon luminescence spectrometer
FluoroMax 4
Horiba JobinYvon
Used for carrying out photoluminescence (PL) spectra.
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NOVA 2200e surface area analyzer
NOVA 2200e
Quantachrome
Used for analyzing specific surface area and pore size distribution.
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HPLC-MS system
Used for detecting the structures of intermediates.
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CHI 660C electrochemical workstation
CHI 660C
Chenhua Instruments Co.
Used for performing transient photocurrent and electrochemical impedance spectroscopy (EIS).
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