研究目的
Investigating the effects of In/Ga doping on the thermoelectric properties of GaSb/InSb crystals to enhance their thermoelectric performance.
研究成果
The highest ZT of 0.56 at 573 K was achieved by Ga doped (1 × 1021/cm3) InSb crystal, which is the highest among other reported values of InSb crystals. The enhancement in the ZT is because of the reduction in the lattice thermal conductivity values through the phonon scattering by the presence of high density of point defects.
研究不足
The study is limited to the effects of In/Ga doping on the thermoelectric properties of GaSb/InSb crystals. The research does not explore other doping elements or the effects of different doping concentrations beyond the specified range.
1:Experimental Design and Method Selection:
In/Ga elements were doped in GaSb/InSb crystals respectively, and their thermoelectric performances were studied. The crystals were synthesized by melt solidification process using high pure, 6N grade In, Ga and Sb elements. Induction heating furnace was used to grow the crystals in a quartz crucible under hydrogen flowing atmosphere.
2:Sample Selection and Data Sources:
GaSb and InSb crystals doped heavily (1 × 1020 and 1 × 1021/cm3) with In and Ga elements respectively, were synthesized.
3:List of Experimental Equipment and Materials:
Induction heating furnace, quartz crucible, high pure, 6N grade In, Ga and Sb elements, Rigaku RINT X-ray diffractometer, JEOL-JXA 8530F field emission electron probe micro analyser, ESCA 3400 electron spectrometer, Ulvac Rico ZEM 3 system, NETZSCH-LFA 447 nanoflash instrument.
4:Experimental Procedures and Operational Workflow:
The furnace was heated up to 720 and 650 °C for the growth of In doped GaSb (GaSb:In) and Ga doped InSb (InSb:Ga) crystals, respectively. The holding time at the growth temperature was 2 h and, the heating and cooling rates of the furnace were fixed to be 10 °C/min for all the experiments. After the growth, the crystals were cut and polished using SiC and alumina abrasives for the analysis process.
5:Data Analysis Methods:
The structural analysis was done by X-ray diffraction (XRD). The compositional distribution was analysed by energy dispersive X-ray (EDX) mapping of the crystals. The binding energies of the elements were analysed using ESCA 3400 electron spectrometer. Ulvac Rico ZEM 3 system was used to measure electrical resistivity and Seebeck co-efficient. The thermal conductivity was measured by laser flash method.
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