研究目的
Investigating the AgIn5Se8 phase formation upon annealing the Ag/In2Se3 bilayer film prepared by the thermal evaporation technique and its impact on optical, morphological, and structural parameters.
研究成果
The study successfully demonstrated the formation of AgIn5Se8 phase through thermal annealing of Ag/In2Se3 bilayer films, with significant changes in optical and structural properties observed. The transformation from amorphous to crystalline phase was confirmed by XRD and Raman spectroscopy, with the optical band gap and other optical constants showing temperature-dependent variations. The findings suggest potential applications in solar cells and optoelectronic devices.
研究不足
The study is limited to the effects of thermal annealing on Ag/In2Se3 bilayer thin films up to 250°C. The investigation does not explore higher annealing temperatures or the effects of other post-deposition treatments. Additionally, the study focuses on a specific composition and does not vary the stoichiometry of the bilayer films.
1：Experimental Design and Method Selection:
The study involved the preparation of Ag/In2Se3 bilayer thin films using the thermal evaporation technique and subsequent annealing at various temperatures to investigate phase transformation and its effects on optical and structural properties.
2：Sample Selection and Data Sources:
The samples were prepared on glass substrates, with the thickness of the films monitored during deposition. The composition was verified using EDAX, and structural characterization was performed using XRD.
3：List of Experimental Equipment and Materials:
Hind high vacuum coating unit (12A4D) for film deposition, ceramic closed tubular furnace for annealing, Bruker D8 Advance for XRD, UV-Visible-NIR spectrometer (Bruker Optics (IFS66v/S) for optical transmission measurements, Raman spectrometer (LabRAM HR system) for Raman spectra, and FESEM with EDAX for microstructural and compositional analysis.
4：Experimental Procedures and Operational Workflow:
The films were deposited at a base pressure of ~5×10?5 Torr, annealed at temperatures ranging from 100°C to 250°C, and characterized using XRD, SEM, EDAX, UV-Visible-NIR spectroscopy, and Raman spectroscopy.
5：Data Analysis Methods:
Optical constants were calculated from transmission data, crystallite size was determined using the Debye-Scherer relation, and band gaps were analyzed using Tauc plots.
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