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Accurate and efficient data acquisition methods for high-resolution angle-resolved photoemission microscopy

DOI:10.1038/s41598-018-34894-7 期刊:Scientific Reports 出版年份:2018 更新时间:2025-09-09 09:28:46
摘要: Angle-resolved photoemission spectroscopy (ARPES) is a powerful experimental technique in materials science, as it can directly probe electronic states inside solids in energy (E) and momentum (k) space. As an advanced technique, spatially-resolved ARPES using a well-focused light source (high-resolution ARPES microscopy) has recently attracted growing interests because of its capability to obtain local electronic information at micro- or nano-metric length scales. However, there exist several technical challenges to guarantee high precision in determining translational and rotational positions in reasonable measurement time. Here we present two methods of obtaining k-space mapping and real-space imaging in high-resolution ARPES microscopy. One method is for k-space mapping measurements that enables us to keep a target position on a sample surface during sample rotation by compensating rotation-induced displacements (tracing acquisition method). Another method is for real-space imaging measurements that significantly reduces total acquisition time (scanning acquisition method). We provide several examples of these methods that clearly indicate higher accuracy in k-space mapping as well as higher efficiency in real-space imaging, and thus improved throughput of high-resolution APRES microscopy.
作者: Hideaki Iwasawa,Eike F. Schwier,Akihiro Ino,Kenya Shimada,Hitoshi Takita,Kazuki Goto,Wumiti Mansuer,Takeo Miyashita,Yoshihiro Aiura
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To develop and evaluate two data acquisition methods for high-resolution angle-resolved photoemission microscopy (μ-ARPES) that improve the accuracy of k-space mapping and the efficiency of real-space imaging.

The tracing ARPES method enabled more accurate μ-ARPES experiments by preventing contamination of signals from different surface domains, and the scanning ARPES method drastically reduced total data acquisition time. These methods significantly improve the accuracy, efficiency, and throughput of high-resolution ARPES microscopy experiments, beneficial for studies of intrinsic local electronic structures of functional materials in micro scales.

The study acknowledges the technical challenges in preserving the resolving power in k- and real-spaces in high-resolution ARPES microscopy, including the need for novel developments on data acquisition methods. The scanning ARPES method, while efficient, has slight ambiguity in the one-to-one correspondence between the ARPES spectrum and the coordinate information due to measurements being performed while moving the position.

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