研究目的
To discuss the combination of two different classes of semiconductors, group IV (like Si and Ge) and group III–V (like GaAs and InP), focusing on nanowires (NWs) as a relatively new materials system that offers enhanced flexibility in combining different semiconductor materials.
研究成果
The nanowire geometry allows for an intimate integration of group III-V and group IV semiconductors, opening the possibility to fabricate unprecedented heterostructures and access new crystal structures with unexplored properties. This creates more freedom in band structure engineering, which is crucial for the electronics industry.
研究不足
The chapter discusses the challenges related to the combination of Si and III-V semiconductors, including the formation of misfit dislocations and antiphase boundaries (APBs) at the heterointerface. It also mentions the limitations of current growth techniques in achieving defect-free heterostructures.
1:Experimental Design and Method Selection:
The chapter discusses the growth of III-V nanowires on group IV substrates using methods such as selective area growth (SAG) and the vapor–liquid–solid (VLS) method. It also covers the growth of heterostructures within nanowires in the radial and axial directions.
2:Sample Selection and Data Sources:
The samples include III-V nanowires grown on Si substrates, with a focus on the epitaxial relationship and the quality of the heterojunctions.
3:List of Experimental Equipment and Materials:
Equipment includes molecular beam epitaxy (MBE), metalorganic vapor phase epitaxy (MOVPE), scanning electron microscopy (SEM), and transmission electron microscopy (TEM). Materials include Si, GaAs, InP, and other III-V semiconductors.
4:Experimental Procedures and Operational Workflow:
The chapter details the cleaning of Si substrates, deposition of catalytic metal particles, and the growth of nanowires and heterostructures. It also discusses the characterization of these structures using SEM and TEM.
5:Data Analysis Methods:
The analysis includes the use of X-ray diffraction pole figure measurements and geometrical phase analysis (GPA) to study the crystallographic relation and strain fields in the nanowires.
独家科研数据包,助您复现前沿成果,加速创新突破
获取完整内容