研究目的
To demonstrate a maskless implantation of an array of bright, single germanium-vacancy (GeV) centers in diamond with high spatial accuracy and creation ratio for scalable quantum photonics applications.
研究成果
The study successfully demonstrates a maskless, targeted fabrication of single germanium center arrays in diamond with nanometer-scale spatial accuracy. The GeV centers exhibit promising optical properties for quantum photonics applications, despite the current low conversion yield. The technique is beneficial for future nanofabrication of integrated photonic structures with GeV emitters.
研究不足
The conversion yield of implanted Ge ions to optically active GeV centers is low (~0.6%), which may be improved by higher implantation doses or other methods such as high temperature annealing and electron irradiation.
1:Experimental Design and Method Selection:
The study employs a direct focused ion beam (FIB) implantation technique for creating single GeV centers in diamond with high spatial accuracy.
2:Sample Selection and Data Sources:
High purity chemical vapor deposition (CVD) diamond from Element Six is used as the target sample.
3:List of Experimental Equipment and Materials:
A commercially available 35 keV nanoFIB system (ionLINE, RAITH Nanofabrication) is used for ion implantation. Confocal microscopy system with 532 nm laser excitation is used for characterization.
4:Experimental Procedures and Operational Workflow:
Ge+ ions are implanted with four doses (100, 200, 400, 700 Ge+ per spot) into the diamond sample, followed by annealing at 1000 °C for 30 minutes in high vacuum.
5:Data Analysis Methods:
Photoluminescence (PL) spectra are measured at room temperature and at 10 K. Second-order correlation function g2(τ) is measured to confirm single photon emission.
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