研究目的
Investigating the effect of simultaneous doping of carbon and nickel on the microstructural, optical, and electrical properties of barium strontium titanate (BST) thin films.
研究成果
The BST4N-4C thin film is the optimum choice for microwave tunable devices and DRAM applications due to its lowest dielectric losses, highest quality factor, and highest figure of merit.
研究不足
The study focuses on the effect of Ni and C doping on BST thin films prepared by the sol-gel method. The results may not be directly applicable to films prepared by other methods or with different dopants.
1:Experimental Design and Method Selection
Thin films of BST were prepared by the sol-gel method in six different compositions. Structural features and chemical bonds of the films were studied by TGA/DSC, XRD, FT-IR, and FE-SEM. The electrical and optical properties of the films were analysed by impedance spectroscopy and UV–VIS spectroscopy.
2:Sample Selection and Data Sources
Analytical grade barium acetate, strontium acetate, nickel acetate, titanium isopropoxide, and polyethylene glycol were used as starting materials. The materials were weighted according to their molecular formula for each thin film.
3:List of Experimental Equipment and Materials
TGA/DSC (Mettler Toledo TGA DSC1), XRD (X′Pert PRO MPD), FT-IR (Spectrum RX I), FE-SEM (MIRA3), impedance spectroscopy (LCR-8110G), UV–VIS spectroscopy (Lambda25).
4:Experimental Procedures and Operational Workflow
The precursor sol of the thin films was prepared by dissolving barium acetate and strontium acetate in glacial acetic acid, adding acetyl acetone, titanium (IV) isopropoxide, and a water and acetic acid mixture. The solutions were dip-coated on alumina substrates and heat-treated at various stages.
5:Data Analysis Methods
The band gap energies were calculated by extrapolating the linear portion of the curves relating (αhν)2 versus hν to (αhν)2 = 0. The dielectric properties were measured with impedance spectroscopy.
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XRD
X′Pert PRO MPD
PANalytical
X-ray diffraction analysis
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FT-IR
Spectrum RX I
PerkinElmer
Fourier transform infrared spectroscopy
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UV–VIS Spectroscopy
Lambda25
PerkinElmer
Measurement of absorption spectra
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TGA/DSC
TGA DSC1
Mettler Toledo
Thermogravimetric analysis and differential scanning calorimetry
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FE-SEM
MIRA3
TESCAN
Field emission scanning electron microscopy
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Impedance Spectroscopy
LCR-8110G
GW Instek
Measurement of dielectric properties
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