研究目的
To investigate the physical properties of semiorganic nonlinear optical Glycine Zinc Sulfate (GZS) single crystal grown by slow evaporation technique.
研究成果
Bulk sized good quality crystals of Glycine Zinc Sulfate (GZS) were grown by slow evaporation technique. The crystal exhibits orthorhombic structure, excellent transmission in the entire visible region, and NLO behavior due to its better optical and dielectric properties. The SHG efficiency of the GZS is greater than KDP. The material has negative photoconductivity nature.
研究不足
The study is limited to the characterization of GZS single crystals grown by slow evaporation technique. The potential areas for optimization include the growth conditions to improve crystal quality and size.
1:Experimental Design and Method Selection:
The GZS crystal was grown by slow evaporation technique. The crystal was characterized by single crystal and powder X-ray diffraction analysis, UV analysis, microhardness, dielectric, SHG, photoconductivity measurements, and etching studies.
2:Sample Selection and Data Sources:
Glycine zinc sulfate was synthesized by dissolving glycine and zinc sulfate in equimolar ratio (1:1) in double distilled water.
3:List of Experimental Equipment and Materials:
ENRAF NONIUS CAD 4 automatic X-ray diffractometer, Leica polarizing microscope, PERKIN ELMER LAMDA Instrument, He-Ne laser, Shimadzu HMV-2000 fitted with Vickers pyramidal indenter, HIOKI 3532-50 HITESTER LCR meter, Keithley 485 picoammeter, Carl Zeiss optical microscope.
4:Experimental Procedures and Operational Workflow:
The solution was stirred continuously using a magnetic stirrer. The obtained saturated solution was further purified and allowed to evaporate at higher temperature. The crystal was characterized by various techniques as mentioned.
5:Data Analysis Methods:
The data was analyzed using standard techniques for each characterization method.
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PERKIN ELMER LAMDA Instrument
LAMDA
PERKIN ELMER
To record the UV-Visible transmission spectrum.
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Shimadzu HMV-2000 fitted with Vickers pyramidal indenter
HMV-2000
Shimadzu
To estimate the hardness of the GZS crystal.
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Keithley 485 picoammeter
485
Keithley
To measure the dark current and photocurrent of the crystal.
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Carl Zeiss optical microscope
Imager AIM
Carl Zeiss
To carry out etching studies.
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ENRAF NONIUS CAD 4 automatic X-ray diffractometer
CAD 4
ENRAF NONIUS
To identify the cell parameters of the grown crystals.
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Leica polarizing microscope
Leica
To study the single crystallinity of the crystal.
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He-Ne laser
To determine the refractive index of the crystals by Brewster’s angle method.
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HIOKI 3532-50 HITESTER LCR meter
3532-50 HITESTER
HIOKI
To carry out dielectric measurements.
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