研究目的
Investigating the production and characterization of cellular structures of various designed densities created with a low loss ceramic material, alumina (aluminum oxide), via vat photopolymerization.
研究成果
Alumina structures with a specified permittivity can be produced via a VP and sintering post printing process. These structures follow the theoretical upper Wiener bound when the feature size of the structure is less than 1/10 of a wavelength. The permittivity of these structures can be easily changed by varying the relative density through modification of the CAD geometry, allowing for a large range of relative permitivitties to be produced in different shapes and sizes within a single dielectric structure.
研究不足
The exploration of cellular structures of varying relative densities is limited to a range between 30% and 70% due to fatal errors in the Autodesk build preparation software for structures with relative densities less than 30% or more than 70%. The loss measurements resulted in a small number of data-points, making the accuracy of the measurements uncertain.
1：Experimental Design and Method Selection:
The study involves the design and printing of green parts with varying relative densities using a VP system, followed by sintering in a high temperature furnace to create solid alumina parts. The permittivity of these structures is measured in the X band (8-12.5 GHz) using a Vector Network Analyzer (VNA).
2：5 GHz) using a Vector Network Analyzer (VNA).
Sample Selection and Data Sources:
2. Sample Selection and Data Sources: Samples are printed as green parts with varying relative densities and sintered to create solid alumina parts. The bulk density of the printed ceramic material is measured using the ASTM B962 – 15 standardized Archimedes measurement.
3：List of Experimental Equipment and Materials:
AutodeskTM Ember VP system, high temperature furnace, Rhode and Swartz ZVA-50 VNA, WR-90 waveguide.
4：Experimental Procedures and Operational Workflow:
Green parts are printed with varying relative densities, sintered, and then measured for permittivity using the VNA connected to a WR-90 waveguide sample holder.
5：Data Analysis Methods:
The permittivity is extracted from the S-parameters using the new non-iterative (NNI) method described by Rohde & Schwarz.
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