研究目的
To identify the photometric, radiometric, and colorimetric signatures of degradations of large area white organic light emitting diodes subjected to various stress conditions.
研究成果
The study demonstrated that thermal stress alone at 60°C does not significantly affect the photometric and colorimetric characteristics of the studied OLED devices. However, combined electrical and thermal stress significantly accelerated degradation, with the blue emitter being the least stable. The findings highlight the importance of controlling both electrical and thermal conditions to extend the lifetime of OLED devices.
研究不足
The study was limited to a specific model of OLED (Philips GL55) and may not be generalizable to other OLED technologies. The highest electrical stress level was set to 15 mA/cm2 due to the risk of catastrophic degradation at higher levels.
1：Experimental Design and Method Selection:
The study involved subjecting OLED devices to various electrical and thermal stress conditions to observe their degradation signatures.
2：Sample Selection and Data Sources:
Nine OLED devices were stressed at different current densities and temperatures, with three additional devices subjected to purely thermal stress for comparison.
3：List of Experimental Equipment and Materials:
The experimental setup included insulated caissons equipped with heaters and fans for temperature control, and a Keithley 2602A source-measure unit for powering the OLEDs. Optical measurements were performed using a spectrometer SPECBOS
4：Experimental Procedures and Operational Workflow:
12 The OLEDs were stressed under controlled conditions, with measurements taken at regular intervals to monitor degradation.
5：Data Analysis Methods:
The study analyzed changes in luminance, spectral radiance, chromaticity coordinates, correlated color temperature, and color rendering index over time.
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