研究目的
Investigating a novel method for determining chromatic dispersion profile from a broadband spectral interferogram obtained by using a white-light interferometry technique.
研究成果
The proposed method allows for determining chromatic dispersion profile from a single spectral interferogram. It is highly tolerable to different types of perturbations of spectral interferograms, including random noise, drift of the zero level and variation of the interference fringes contrast. The method was validated in dispersion measurements of the SMF-28 optical fiber and the BK7 glass plate, showing relative errors not exceeding 3% of the maximum dispersion value measured for both samples.
研究不足
The method is best suited for processing interferograms with modulation around a zero level and slowly changing envelope. It requires the sign of dispersion to be identified by an observation of a displacement of interference fringes in response to variation of reference arm length.
1：Experimental Design and Method Selection:
The method is based on direct calculations of a second derivative of the registered spectral intensity at extremal points.
2：Sample Selection and Data Sources:
Commercially available samples like the BK7 glass plate and the Corning SMF-28 optical fiber were used.
3：List of Experimental Equipment and Materials:
Mach-Zehnder interferometer, Michelson interferometer, broadband light source (supercontinuum or halogen lamp), beam splitters, coupling objectives, mirrors, spectral detector, fiber under test, glass sample.
4：Experimental Procedures and Operational Workflow:
Spectral interferograms were registered and processed to determine chromatic dispersion.
5：Data Analysis Methods:
The second derivative of the spectral intensity at extremal points was calculated numerically, and the phase difference derivative was approximated in the whole spectral range using Laurent’s polynomial function.
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