研究目的
Investigating the fabrication of lightweight tungsten nanotips using a two-step electrochemical etching technique for high Q-factor quartz tuning fork force sensors in atomic force microscopy applications.
研究成果
The two-step electrochemical etching technique successfully fabricated lightweight tungsten nanotips, enabling the development of high Q-factor QTF force sensors. These sensors demonstrated significant improvement in Q-factor without the need for mass rebalancing or Q-control techniques, validated by high-resolution AFM imaging.
研究不足
The etching time for the first step is not universal and depends on wire diameter, immersion depth, electrolyte concentration, and signal shape, frequency, and amplitude. The method requires precise control of the etching process to achieve the desired tip geometry.
1：Experimental Design and Method Selection:
A two-step electrochemical etching technique was employed to fabricate lightweight tungsten nanotips. The first step involved etching a tungsten wire with a trapezoidal waveform to form a micro-needle, and the second step used direct current etching to create a sharp tip apex.
2：Sample Selection and Data Sources:
Tungsten wires with diameters of 100 or 200 μm were used as the starting material. The fabricated nanotips were characterized using optical microscopy and scanning electron microscopy (SEM).
3：List of Experimental Equipment and Materials:
The setup included a potassium hydroxide (KOH) solution container, stainless steel electrodes, a CCD camera, a wire holder, an oscilloscope (Agilent In?niiVision DSO-X4024A) with integrated function generators, and a DC voltage source.
4：Experimental Procedures and Operational Workflow:
The tungsten wire was first etched with a trapezoidal signal, then elevated and etched with a DC potential to form a sharp tip apex. The process was monitored and controlled using precision microstages.
5：Data Analysis Methods:
The Q-factor and resonance frequency of the sensors were measured with Nanonis electronics (SPECS Zurich GmbH). SEM imaging was used for tip characterization.
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