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Insight of surface treatments for CMOS compatibility of InAs nanowires

DOI:10.1007/s12274-018-2257-8 期刊:Nano Research 出版年份:2018 更新时间:2025-09-04 15:30:14
摘要: A CMOS compatible process is presented in order to grow self-catalyzed InAs nanowires on silicon by molecular beam epitaxy. The crucial step of this process is a new in-situ surface preparation under hydrogen (gas or plasma) during the substrate degassing combined with an in-situ arsenic annealing prior to growth. Morphological and structural characterizations of the InAs nanowires are presented and growth mechanisms are discussed in detail. The major influence of surface termination is exposed both experimentally and theoretically using statistics on ensemble of nanowires and density functional theory (DFT) calculations. The differences observed between Molecular Beam Epitaxy (MBE) and Metal Organic Vapor Phase Epitaxy (MOVPE) growth of InAs nanowires can be explained by these different surfaces terminations. The transition between a vapor solid (VS) and a vapor liquid solid (VLS) growth mechanism is presented. Optimized growth conditions lead to very high aspect ratio nanowires (up to 50 nm in diameter and 3 micron in length) without passing the 410 °C thermal limit, which makes the whole process CMOS compatible. Overall, our results suggest a new method for surface preparation and a possible tuning of the growth mechanism using different surface terminations.
作者: Daya S. Dhungana,Anne Hemeryck,Nicolo Sartori,Pier-Francesco Fazzini,Filadelfo Cristiano,Sébastien R. Plissard
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To propose a CMOS compatible process for the growth of self-catalyzed InAs nanowires on silicon by molecular beam epitaxy, focusing on the influence of surface preparation under hydrogen and arsenic annealing on the growth mechanisms.

The study successfully demonstrates a CMOS compatible process for growing self-catalyzed InAs nanowires on silicon without exceeding the 410 °C thermal limit. The hydrogen preparation and arsenic annealing are crucial for controlling the growth mechanisms and achieving high aspect ratio nanowires. The findings suggest a new method for surface preparation and the possibility of tuning the growth mechanism through different surface terminations.

The study is limited to the growth of InAs nanowires on silicon using MBE, with a focus on surface preparation and growth mechanisms. The comparison with MOVPE growth is discussed but not experimentally explored in this study.

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