研究目的
To propose a new aging mitigation control (AMC) method to enhance the reliability of multilevel inverters (MIs) against the aging effects in power devices.
研究成果
The proposed AMC method is advantageous as it controls the inverter at wide range of aging, generalized, and it can effectively reduce thermal stresses from aged devices. The simulation and experimental results showed superior reliability enhancement of the PV system.
研究不足
The proposed method reduces the output power in high aging level region and multiple devices failures, which may limit the system's performance.
1：Experimental Design and Method Selection:
The proposed AMC method adapts itself according to the measured aging level of the device and whether a single or multiple device aging. It maintains continuous operation of the PV system without deteriorating the performance of the inverter system.
2：Sample Selection and Data Sources:
The performance of the proposed AMC method is verified using simulation and experimental results.
3：List of Experimental Equipment and Materials:
A scaled down prototype of T-type inverter is used for experimental verification.
4：Experimental Procedures and Operational Workflow:
The proposed method controls the inverter at wide range of aging, generalized, and it can effectively reduce thermal stresses from aged devices.
5：Data Analysis Methods:
The simulation and experimental results are compared to conventional methods to show the effective performance of the proposed AMC method.
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