摘要： Localized surface plasmon resonances (LSPRs) are the coherent and collective oscillations of conduction band electrons at the surface of metallic nanoparticles. LSPRs are known to localize far-field light to a sub-diffraction-limited length scale, yielding an intense electric field at the particle surface. This effect has been harnessed to dramatically enhance light-matter interactions, leading to a variety of applications such as surface-enhanced Raman spectroscopy (SERS), photothermal cancer therapy and solar energy harvesting. Though a variety of near- and far-field optical methods are used to probe LSPRs, the spatial resolution of these methods is on the order of tens of nanometers, limiting their effectiveness. In contrast, electron energy loss spectroscopy (EELS) performed in a scanning transmission electron microscope (STEM) combines sub-nanometer resolving power with the capability to excite both optical-accessible and –inaccessible plasmon modes and therefore has emerged as one of the leading techniques (Figure 1). In this presentation, I will briefly introduce the STEM/EELS technique and demonstrate the power of STEM/EELS in the characterization of LSPRs. In addition to the traditional use of STEM/EELS for LSPR imaging, we have recently demonstrated that STEM/EELS can also be used to spatially map LSP-semiconductor energy transfer at the nanoscale. The future of STEM/EELS as a window into the nanoscopic world is especially promising, and we expect continued advances in the molecular, optical, materials, information, and energy sciences as a result.