研究目的
To systematically study the deposition of ZnSnN2 by co-sputtering, investigating the influence of different deposition parameters on the structural, optical, and electrical properties, and to find methods to prepare phase-pure ZnSnN2 with higher mobility.
研究成果
ZnSnN2 can be fabricated with relatively wide deposition parameters; optimal conditions include substrate temperature around 350°C, N2 flow rate of 6-8 sccm, and higher work pressures (e.g., 7.0 Pa) for lower electron density and higher mobility. The films are wurtzite with lattice constants a ≈ 3.36-3.40 ? and c ≈ 5.49 ?, and optical band gaps around 2.0-2.2 eV.
研究不足
The samples are not stoichiometric, with Zn content over Sn; high electron density due to residual oxygen; difficulty in estimating exact band gap due to degeneracy effects; need for further research to conclusively determine crystalline structure.
1:Experimental Design and Method Selection:
Co-sputtering using a multi-target magnetron sputtering system with RF power for Zn target and DC power for Sn target, varying parameters like substrate temperature, N2 flow rate, work pressure, substrate bias voltage, and Sn target power.
2:Sample Selection and Data Sources:
Substrates used were K9 glass and Si (100) wafers, cleaned ultrasonically in acetone, ethanol, and deionized water.
3:List of Experimental Equipment and Materials:
Multi-target magnetron sputtering system (JGP 450, SKY Technology Development Corporation Limited, Chinese Academy of Sciences), zinc plate (Zn,
4:999%), tin plate (Sn, 999%), argon (Ar, 99%), nitrogen (N2, 999%), K9 glass, Si (100) wafers, acetone, ethanol, deionized water. Experimental Procedures and Operational Workflow:
Base pressure of
5:0 × 10^-4 Pa, Ar flow rate fixed at 20 sccm, N2 flow rate varied, substrate rotation at 6π rad/s, RF power for Zn target fixed at 40 W, DC power for Sn target varied, substrate temperatures varied, sputtering for 1 hour after 5 min target cleaning. Data Analysis Methods:
XRD for structure, UV/VIS spectrophotometer for optical properties, SEM for morphology and thickness, EDX for composition, Hall effect measurements for electrical properties.
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