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Geometric parameters effect of the atomic force microscopy smart piezoelectric cantilever on the different rough surface topography quality by considering the capillary force

DOI:10.1002/jemt.23195 期刊:Microscopy Research and Technique 出版年份:2018 更新时间:2025-09-23 15:23:52
摘要: Nowadays, the atomic force microscopy (AFM) is widely used in the nanotechnology as a powerful nano-robot. The surface topography in Nanoscale is by far one of the most important usages of the AFM device. Hence, in this article, the vibration motion of a piezoelectric rectangular cross-section micro-cantilever (MC) which oscillates in the moist environment has been examined based on the Timoshenko beam theory. After extracting the MC governing equations according to Hamilton's principle, the finite element method has been used to discretize the motion equations. The surface topography has been simulated for various roughness forms in the tapping and non-contact modes by considering the effects of the Van der Waals, capillary and contact forces. Also, the experimental results obtained from the glass surface topography have been simulated. The results illustrate that the time delay in higher natural frequencies in the tapping mode is shorter in comparison with the non-contact mode, especially, for the lower natural frequencies. The sensitivity analysis of the natural frequencies, topography depth and time delay have been simulated. Results indicate that the most effective parameter is the MC length. In the first mode, the first section length has the highest effect on the surface topography time delay, also, in the second vibration mode; the most effective parameter on the time delay is the MC tip length based on the simulation results.
作者: Alireza Habibnejad Korayem,Mitra Taghizadeh,Moharam Habibnejad Korayem
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Investigating the effect of geometric parameters of an atomic force microscopy smart piezoelectric cantilever on the quality of different rough surface topographies by considering capillary force.

The Timoshenko beam theory provides more accurate modeling of AFM piezoelectric micro-cantilever vibrations compared to Euler-Bernoulli theory, reducing error in frequency and amplitude predictions. Higher vibration modes offer better accuracy in surface topography, with shorter time delays in tapping mode. Sensitivity analysis shows that length parameters, particularly the first section length and tip length, have the most significant impact on natural frequencies and topography quality, while width parameters have minimal effect. This approach enhances the quality of AFM topography images by improving the understanding of geometric parameter influences.

The study assumes a moist environment with specific force constants; effects of temperature variations and liquid environments are not fully explored. The model is based on Timoshenko beam theory, which may have limitations for very high-frequency modes or complex material behaviors. Experimental validation is limited to glass surfaces, and applicability to other materials or conditions may require further investigation.

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