研究目的
To propose an exact ellipsometric method for investigating coherent light with small ellipticity, avoiding interference of multiple internal reflections and improving measurement accuracy.
研究成果
The proposed ellipsometric method is precise for measuring small ellipticities in coherent light, avoiding interference effects and achieving a relative error not exceeding 0.02 for ellipticities from 8.0×10?? to 5.0×10?3. It is suitable for research labs and can be adapted for various ellipticity ranges by selecting appropriate compensators.
研究不足
The method's accuracy decreases for ellipticities below 8.0×10??, with relative error increasing up to 0.15 in the range of 3.5×10?? to 8.0×10??. It requires precise angular measurements and is limited by the compensator's phase retardation.
1：Experimental Design and Method Selection:
The method uses Jones calculus and the generalized matrix equivalence theorem for polarization theory to describe the conversion of elliptically polarized light into linearly polarized light by a compensator. It involves selecting compensators with specific phase retardations to maximize accuracy for given ellipticity ranges and avoid interference effects.
2：Sample Selection and Data Sources:
Elliptically polarized light is generated using a setting retardation plate with known parameters, and measurements are performed on this light.
3：List of Experimental Equipment and Materials:
Includes a He-Ne laser, semitransparent plate, mirrors, scale, polarizer (Glan prism), analyzer, setting retardation plate (mica), compensator (made from two mica plates), and a telescope.
4：Experimental Procedures and Operational Workflow:
The setup involves generating linearly polarized light, converting it to elliptically polarized light using the setting retardation plate, passing it through the compensator and analyzer, rotating the compensator and analyzer to find extinction positions, and measuring angles to calculate ellipticity.
5：Data Analysis Methods:
Equations derived from Jones calculus (e.g., Eq. 9 and 13) are used to compute ellipticity from measured angles, with error analysis based on angle measurement accuracy.
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