1：Experimental Design and Method Selection:

A dual precursor modi?cation/hybridization process using methyltriethoxysilane (MTES) and tetraethylorthosilicate (TEOS) with hollow silica nanospheres (HSNs) was employed to create AR coatings. The sol-gel method was used for synthesis, with careful control of precursor ratios and reaction conditions to balance hydrophobicity, mechanical strength, and optical properties.

2：Sample Selection and Data Sources:

Low iron glass, silicon, and aluminum substrates were used for coating. Crystalline silicon mini-modules were fabricated for photovoltaic performance evaluation. Dust particles from a test chamber were used for dust resistance tests.

3：List of Experimental Equipment and Materials:

Materials included poly(acrylic acid), TEOS, MTES, ammonium hydroxide, ethanol, hydrochloric acid, and ultrapure water. Equipment included TEM (JEOL JEM2100), spectroscopic ellipsometer (M2000-DI, J.A. Woollam Co.), UV-Vis-NIR spectrophotometer (Lambda 950, Perkin-Elmer), SEM (Hitachi S-4800), FTIR (Nicolet 6700, Thermo), contact angle system (OCA 20, Dataphysics), HAST chamber (PC-422R8, Hirayama), wet abrasion scrub tester (JTX-II, Pushen), solar simulator (Wacom WXS-220 S-L2), and dust test chamber (MR-H5B, ESON).

4：Experimental Procedures and Operational Workflow:

HSN sols were synthesized via a modi?ed St?ber method. MTES was added to HSN sols at varying molar ratios to form MHSN sols, followed by TEOS addition to form TMHSN sols. Coatings were applied by dip-coating on substrates and annealed. Mini-modules were encapsulated with EVA and glass. Tests included TEM, ellipsometry, transmittance measurements, contact angle, HAST, abrasion tests, I-V measurements, and dust settling/removal tests.

5：Data Analysis Methods:

Refractive indices were extracted using a Cauchy model from ellipsometry data. Transmittance spectra were analyzed for average and maximum values. Statistical analysis of photovoltaic parameters (Jsc, PCE, Voc, FF) was performed. Degradation rates were calculated from pre- and post-test measurements.