研究目的
To investigate the photocatalytic oxidation of thiophene using cerium-doped TiO2 thin films prepared by sol-gel method, focusing on structural characterization, electron trapping, adsorption behavior, and photocatalytic activity enhancement.
研究成果
Cerium doping in TiO2 enhances photocatalytic activity for thiophene oxidation by reducing particle size, trapping electrons to inhibit recombination, improving adsorption, and leading to higher product formation, with 2%Ce/TiO2 showing optimal performance despite higher adsorption in 8%Ce/TiO2.
研究不足
The study is limited to specific cerium doping concentrations (2% and 8%), thin film configurations, and laboratory-scale experiments. Potential optimizations could include varying doping levels, exploring other pollutants, or scaling up for industrial applications.
1:Experimental Design and Method Selection:
The study employed a sol-gel method for catalyst preparation, with characterization techniques including XRD, TEM, EXAFS, CV, DRIFTS, and XPS to analyze structural properties, electron behavior, and photocatalytic oxidation processes.
2:Sample Selection and Data Sources:
TiO2 and Ce/TiO2 thin films with 2% and 8% cerium doping were prepared on ITO glass substrates. Data were sourced from laboratory experiments using synthesized catalysts.
3:List of Experimental Equipment and Materials:
Equipment included Philips X'Pert-MPD diffractometer, LaB6 Hitachi H-8100 TEM, VG Scientific 110 energy analyzer, IM6 Electrochemical Workstation, Bruker Tensor 27 spectrometer, and various lamps for irradiation. Materials included Titanium(IV) bis(ethylacetoacetato)diisopropoxide, cerium(III) nitrate hexahydrate, ITO glass, sodium sulfate, and thiophene.
4:Experimental Procedures and Operational Workflow:
Catalysts were prepared via sol-gel, coated on ITO, calcined, and characterized. Photocatalytic oxidation was monitored in situ using DRIFTS under UV irradiation in an oxygen atmosphere at 288 K.
5:Data Analysis Methods:
Data were analyzed using EXAFSPAK software for EXAFS, Advantage software for XPS deconvolution, and standard techniques for XRD, TEM, CV, and IR spectroscopy.
独家科研数据包,助您复现前沿成果,加速创新突破
获取完整内容-
Transmission electron microscope
Hitachi H-8100
Hitachi
Used for TEM analysis to observe particle sizes and electron diffraction patterns.
-
Spectrometer
Bruker Tensor 27
Bruker
Used for in situ DRIFTS to monitor photocatalytic oxidation.
-
X-ray diffractometer
Philips X'Pert-MPD
Philips
Used for X-ray diffraction experiments to investigate catalyst phases.
-
Energy analyzer
VG Scientific 110
VG Scientific
Used for XPS experiments to analyze surface composition.
-
Electrochemical workstation
IM6
Zahner Elektrik
Used for cyclic voltammetry to measure photocurrent.
-
Halogen lamp
5025AF-S
Braun
Used for photocatalytic activation in electrochemical measurements.
-
High-pressure Hg lamp
Not specified
Not specified
Used for UV irradiation in photocatalytic experiments.
-
ITO glass
Not specified
Not specified
Used as substrate for coating catalyst thin films.
-
登录查看剩余6件设备及参数对照表
查看全部