研究目的
To design a narrowband and full-angle refractive index sensor based on Tamm plasmon resonance (TPR) using a planar multilayer structure for high-sensitivity and cost-effective detection.
研究成果
The proposed planar multilayer structure enables high-performance refractive index sensing with sensitivities up to 860 nm/RIU and FOM up to 391, sustained over a wide angle range. It offers advantages of easy fabrication and cost-effectiveness compared to nanostructured sensors, with potential applications in chemical and biomedical monitoring.
研究不足
The study is based on numerical simulations without experimental validation. The sensor performance may be affected by fabrication imperfections, and the range of refractive indices tested is limited to 1.32-1.42. Angular performance shows degradation under TM-polarized light at high angles.
1：Experimental Design and Method Selection:
The study employs numerical simulations to design a planar multilayer structure comprising a distributed Bragg reflector (DBR), a non-adjacent Au layer, and a cavity for analyte flow. Rigorous coupled-wave analysis (RCWA) and finite-element method (FEM) are used to simulate optical dispersion characteristics and electromagnetic field distributions.
2：Sample Selection and Data Sources:
The analyte refractive indices range from
3：32 to 42, typical for fluids, with optical constants sourced from Palik's handbook. List of Experimental Equipment and Materials:
Materials include Al2O3, TiO2 for the DBR, Au for the metal layer, and SiO2 substrate. No specific equipment models or brands are mentioned; simulations are computational.
4：Experimental Procedures and Operational Workflow:
The cavity height (H), Au layer thickness (dAu), number of DBR pairs (NDBR), and central wavelength of DBR (λDBR) are varied to optimize TPR excitation. Reflection spectra are calculated for different analytes and incident angles.
5：Data Analysis Methods:
Sensitivity (S) is defined as the change in resonance wavelength per refractive index unit, FWHM is measured, and figure of merit (FOM) is calculated as S/FWHM. Linear regression is used for calibration curves.
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