1：Experimental Design and Method Selection:

The study uses an AFM-based approach to apply mechanical stress to a 2DM/polymer composite, creating localized strain fields to induce SPEs. The rationale is to achieve nanometer-scale precision in SPE placement.

2：Sample Selection and Data Sources:

Monolayer WSe2 grown by chemical vapor deposition is transferred onto PMMA films of varying thicknesses (e.g., 70 nm and 320 nm) on SiO2/Si substrates.

3：List of Experimental Equipment and Materials:

AFM (Park Systems NX10), cantilevers (Nanosensors SSS-NCHR, DT-NCHR, NCHR), PMMA, SiO2/Si wafers, WSe2, cryostats (Montana Instruments Cryostation C2), lasers (HeNe laser, Ti:sapphire laser), spectrometers, detectors (Si avalanche photodiodes).

4：Experimental Procedures and Operational Workflow:

AFM indentation is performed with controlled force or displacement; fluorescence imaging and photoluminescence mapping are conducted at low temperatures (e.g., 4 K) to detect SPEs; autocorrelation and time-resolved PL measurements are used to confirm single photon emission.

5：Data Analysis Methods:

Statistical analysis of indent depths and emission wavelengths, exponential fitting for lifetime measurements, and calculation of g(2)(0) values for antibunching confirmation.