研究目的
To investigate the effect of incorporating Er2O3-doped particles on the structural and luminescence properties of phosphate glasses, aiming to fabricate glasses with enhanced emission at 1.5 μm using the direct doping method.
研究成果
The direct doping method allows for the incorporation of Er2O3-doped particles into phosphate glasses, but particle survival depends on the processing temperature. Lower temperatures (e.g., 550°C) in NaPF glasses enable better particle preservation and enhanced luminescence properties, confirming the method's potential for developing new active glasses with controlled Er3+ ion environments.
研究不足
The main limitation is the degradation of particles during glass melting at higher temperatures (e.g., 1000°C), leading to dissolution and reduced survival of particles. This limits the effectiveness of the direct doping method for certain glass compositions. Optimization is needed for temperature control and particle stability to minimize decomposition.
1:Experimental Design and Method Selection:
The study involved synthesizing Er2O3-doped TiO2, ZnO, and ZrO2 particles via sol-gel method and incorporating them into phosphate glasses using the direct doping method. The rationale was to control the local environment of Er3+ ions independently of the glass composition to enhance luminescence properties. Methods included sol-gel synthesis, melt-quenching for glass preparation, and various characterization techniques.
2:Sample Selection and Data Sources:
Samples included Er2O3-doped particles (TiO2, ZnO, ZrO2) and phosphate glasses with compositions 50P2O5-40SrO-10Na2O (SrNaP), 90NaPO3-10Na2O (NaPF0), and 90NaPO3-10NaF (NaPF10). Particles were synthesized with specific Er2O3 concentrations (14.3 mol% for TiO2 and ZnO, 7 mol% for ZrO2).
3:0). Particles were synthesized with specific Er2O3 concentrations (3 mol% for TiO2 and ZnO, 7 mol% for ZrO2). List of Experimental Equipment and Materials:
3. List of Experimental Equipment and Materials: Equipment included FE-SEM (Zeiss Merlin 4248, Carl Zeiss Crossbeam 540), EDS (Oxford Instruments X-ACT, X-MaxN 80), XRD (Philips X'pert), TGA (Perkin Elmer TGS-2), spectrometer (Jobin Yvon iHR320), detectors (Hamamatsu P4631-02, Thorlabs PDA10CS-EC), laser diode (CM962UF76P-10R), oscilloscope (Tektronix TDS350), and filters (Thorlabs FEL 1500). Materials included chemical precursors (e.g., titanium(IV) butoxide, erbium(III) acetate, zinc acetate dihydrate) from Sigma-Aldrich and others.
4:0). Materials included chemical precursors (e.g., titanium(IV) butoxide, erbium(III) acetate, zinc acetate dihydrate) from Sigma-Aldrich and others. Experimental Procedures and Operational Workflow:
4. Experimental Procedures and Operational Workflow: Particles were synthesized via sol-gel, calcined, and characterized. Glasses were melted in quartz crucibles, particles were added at specific temperatures (1000°C for SrNaP, 550°C for NaPF glasses), quenched, annealed, and polished. Characterization involved FE-SEM/EDS for morphology and composition, XRD for crystallinity, TGA for thermal stability, emission spectra and lifetime measurements at 976 nm excitation.
5:Data Analysis Methods:
Data were analyzed using EDS for elemental mapping (±1.5 mol% accuracy), XRD patterns compared to reference databases, emission spectra normalized, lifetime values fitted with single exponential decay, and statistical errors considered (e.g., ±0.2 ms for lifetime).
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FE-SEM
Zeiss Merlin 4248
Carl Zeiss
Used for determining the composition and morphology of particles and particles-containing glasses.
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FE-SEM
Carl Zeiss Crossbeam 540
Carl Zeiss
Used for determining the composition and morphology of particles-containing glasses with EDS detector.
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EDS
Oxford Instruments X-ACT
Oxford Instruments
Energy dispersive spectroscopy for elemental mapping and composition analysis.
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EDS
Oxford Instruments X-MaxN 80
Oxford Instruments
Energy dispersive spectroscopy for elemental mapping in glasses.
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TGA
Perkin Elmer TGS-2
PerkinElmer
Thermogravimetric analysis for measuring thermal stability of particles.
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Detector
Hamamatsu P4631-02
Hamamatsu Photonics
Detector for emission spectra measurements.
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Filter
Thorlabs FEL 1500
Thorlabs
Filter used in emission spectra measurements.
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Oscilloscope
Tektronix TDS350
Tektronix
Digital oscilloscope for recording fluorescence lifetime signals.
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Detector
Thorlabs PDA10CS-EC
Thorlabs
Detector used for fluorescence lifetime measurements.
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XRD
Philips X'pert
Philips
X-ray diffraction analyzer for identifying crystalline phases.
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Spectrometer
Jobin Yvon iHR320
Horiba Jobin Yvon
Used for measuring emission spectra in the 1400-1700 nm range.
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Laser Diode
CM962UF76P-10R
Oclaro
Single-mode fiber pigtailed laser diode for excitation at 976 nm.
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