研究目的
To fabricate non-doped phosphorescent OLEDs with an exciplex forming planar structure for efficiency enhancement and to optimize the thickness of the phosphor layer.
研究成果
The fabricated PHOLEDs with a non-doped phosphorescent dye in an exciplex forming planar structure achieved high efficiencies (PE of 37.4 lm/W, CE of 40.5 cd/A, EQE of 14.3%) and reduced efficiency roll-off compared to non-exciplex devices. This is attributed to eliminated triplet energy leakage, efficient up-conversion, and complete F?rster energy transfer. The work provides an easily fabricated and cost-effective approach for high-performance OLEDs, with potential for further optimization.
研究不足
The study is limited to specific materials (TCTA, TPBi, (tbt)2Ir(acac)) and device structures. The efficiency could be further improved by optimizing interface morphology and selecting other luminous dyes. Measurements were done without encapsulation, which might affect long-term stability.
1:Experimental Design and Method Selection:
The study involved designing OLEDs with a non-doped phosphorescent dye layer inserted in an exciplex forming planar structure. The thickness of the phosphor layer was optimized (0.1, 0.5, and 1 nm) to achieve high efficiency. Devices were fabricated with and without exciplex interfaces for comparison.
2:1, 5, and 1 nm) to achieve high efficiency. Devices were fabricated with and without exciplex interfaces for comparison. Sample Selection and Data Sources:
2. Sample Selection and Data Sources: Indium tin oxide (ITO) coated glass substrates were used as anodes. Organic functional layers and metallic cathodes were thermally evaporated. Two series of devices (A-series without exciplex and B-series with exciplex) were fabricated with specific layer configurations.
3:List of Experimental Equipment and Materials:
Equipment includes ultrasonic cleaners, thermal evaporation systems, quartz crystal oscillators for thickness monitoring, UV-Vis spectrophotometer (SHIMATZU UV-1700), photoluminescence spectrometer (PerkinElmer LS55), EL spectrometer (OPT-2000), PL transient decay measurement system (HORIBA Scientific Single Photon Counting Controller FluoroHub-B with NanoLED-370 and TBX photon detector), and J-V-L measurement system (Keithley 4200 source and ST-86LA luminance meter). Materials include ITO, MoO3, NPB, TCTA, TPBi, Bphen, Mg:Ag, and (tbt)2Ir(acac).
4:Experimental Procedures and Operational Workflow:
Substrates were cleaned and treated with oxygen plasma. Organic layers and cathodes were deposited via thermal evaporation under vacuum. Device configurations were ITO/MoO3(5 nm)/NPB(50 or 40 nm)/(tbt)2Ir(acac)(X nm)/TPBi(10 nm)/Bphen(40 nm)/Mg:Ag(100 nm) for A-series and ITO/MoO3(5 nm)/NPB(40 nm)/TCTA(10 nm)/(tbt)2Ir(acac)(X nm)/TPBi(10 nm)/Bphen(40 nm)/Mg:Ag(100 nm) for B-series. Optical and electrical characterizations were performed at room temperature.
5:Data Analysis Methods:
UV-Vis and PL spectra were analyzed to study material properties. J-V-L characteristics were measured to assess electrical performance. PL transient decay was used to investigate energy transfer mechanisms. Efficiency parameters (PE, CE, EQE) were calculated using standard formulas.
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Source meter
4200
Keithley
Testing current density-voltage characteristics of devices.
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UV-Vis spectrophotometer
UV-1700
SHIMATZU
Collecting ultraviolet-visible absorption spectra of organic materials.
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Photoluminescence spectrometer
LS55
PerkinElmer
Characterizing photoluminescence spectra at an excitation wavelength of 325 nm.
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PL transient decay measurement system
FluoroHub-B with NanoLED-370 and TBX photon detector
HORIBA Scientific
Measuring photoluminescence transient decay characteristics under nitrogen atmosphere.
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EL spectrometer
OPT-2000
Not specified in paper
Recording electroluminescence spectra of devices.
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Luminance meter
ST-86LA
Not specified in paper
Measuring luminance of devices.
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Quartz crystal oscillator
Not specified in paper
Not specified in paper
In situ monitoring of deposition rate and layer thickness during thermal evaporation.
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Thermal evaporation system
Not specified in paper
Not specified in paper
Depositing organic functional layers and metallic cathodes under vacuum.
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