研究目的
To investigate the effects of LNO buffer layers on the structure, dielectric, and ferroelectric properties of BFO-PT thin films deposited on stainless steel substrates.
研究成果
BFO-PT thin films with LNO buffer layers on SS substrates exhibit enhanced dielectric and ferroelectric properties, including reduced dielectric loss and leakage current, improved crystallinity, and better fatigue resistance, attributed to mitigated oxygen vacancies and remnant stresses.
研究不足
The study is limited to specific thicknesses of LNO buffer layers and may not cover all possible variations; the use of stainless steel substrates could introduce issues like oxidation or thermal mismatch not fully mitigated.
1：Experimental Design and Method Selection:
BFO-PT thin films were prepared on LNO-coated stainless steel substrates using the sol-gel method to study the impact of LNO buffer layers on electrical properties.
2：Sample Selection and Data Sources:
Stainless steel substrates were used; LNO and BFO-PT precursor sols were prepared with specific molar ratios and solvents.
3：List of Experimental Equipment and Materials:
Equipment includes X-ray diffraction meter (XRD, DLMAX-2550), scanning electron microscope (FE-SEM, JEOL, JSM7000F), step meter (KOSAKA LAB ET 150), double electric four probe tester (SDY-5), impedance analyzer (Agilent 4294A), and ferroelectric tester (Radiant Technology, Precision Premier II). Materials include nitrates of nickel and lanthanum, Bi(NO3)3·5H2O, Fe(NO3)3·9H2O, Pb(CH3COO)2, Ti(OC3H7)4, ethylic acid, 2-methoxyethanol, and Au for electrodes.
4：Experimental Procedures and Operational Workflow:
LNO sol was spin-coated on SS substrates, heat-treated at 550°C for 5 min in oxygen, repeated for thickness control, annealed at 700°C for 15 min in O
5：BFO-PT films were deposited, annealed at 600°C for 30 min using RTA furnace, and Au electrodes were sputtered. Data Analysis Methods:
XRD for phase structure, SEM for morphology, step meter for thickness, four probe tester for resistivity, impedance analyzer for dielectric properties, ferroelectric tester for P-E loops and leakage current.
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