研究目的
To investigate the substrate effect on the ferroelectric and piezoelectric properties of P(VDF-TrFE) thin films by comparing their characteristics on Pt and ITO substrates.
研究成果
P(VDF-TrFE) thin films on Pt substrate exhibited superior ferroelectric and piezoelectric properties due to larger rod diameters and better crystallinity, while films on ITO substrate showed potential for transparent and flexible applications. The substrate type significantly influences the material properties.
研究不足
The study is limited to specific substrates (Pt and ITO) and annealing conditions; other substrates or processing parameters were not explored. The imprint effect in hysteresis loops was noted but not fully mitigated. The piezoelectric coefficient for ITO substrate was estimated but not fully quantified.
1:Experimental Design and Method Selection:
The study used spin coating to fabricate P(VDF-TrFE) thin films on different substrates (Pt/Ti/SiO2/Si(1 1 1) and ITO/glass) and annealed them at 140°C to induce β-phase crystallinity. Analytical methods included XRD, P-E hysteresis measurements, AFM, and PFM to assess crystallinity, ferroelectricity, surface morphology, and piezoelectricity.
2:Sample Selection and Data Sources:
P(VDF-TrFE) 70/30 copolymer solution (2 wt% in methylethylketone) was used. Substrates were Pt/Ti/SiO2/Si(1 1 1) (crystalline) and ITO/glass (polycrystalline).
3:List of Experimental Equipment and Materials:
Spin coater, thermal evaporator for Al electrodes, SmartLab XRD (Rigaku), precision LC analyzer (Radiant Technologies Inc.), AFM (XE-100, Parksystems), PFM.
4:Experimental Procedures and Operational Workflow:
Films were spin-coated at 2000 rpm for 10 s, dried at 70°C for 10 min, annealed at 140°C for 2 h. Al electrodes were deposited. XRD measured crystallinity, P-E loops measured ferroelectric hysteresis, AFM measured surface morphology, PFM measured ferroelectric and piezoelectric properties.
5:Data Analysis Methods:
XRD patterns analyzed for β-phase peak, P-E loops analyzed for remnant polarization and coercive field, AFM images analyzed for surface roughness and rod dimensions, PFM analyzed phase and amplitude responses.
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