研究目的
To evaluate methods for determining the series resistance parameter for the single diode equivalent circuit model of photovoltaic devices from IV curves, and to propose an alternative method that estimates series resistance jointly with other parameters.
研究成果
The analyzed methods for estimating series resistance from IV curves are unreliable for accurately determining the series resistance parameter in the single diode model, especially in the presence of measurement noise. The series resistance must be estimated jointly with other model parameters to achieve better accuracy. The proposed alternative method provides more reliable estimates but is still affected by errors in parameter estimation, highlighting the challenges in photovoltaic parameter extraction.
研究不足
The study relies on simulated IV curves rather than measured data, which assumes the single diode model is perfectly applicable. The accuracy of the proposed method is sensitive to measurement errors, particularly for shunt resistance estimation, and requires multiple IV curves at different irradiances. The methods may not generalize well to all types of PV modules, as shown by poorer performance for CdTe modules.
1：Experimental Design and Method Selection:
The study uses simulated IV curves generated with known parameters from the CEC model to analyze five published methods (Swanson, suns-Voc, Bowden and Rohatgi, IEC 60891-1, IEC 60891-2) for estimating series resistance. An alternative method is proposed that jointly estimates all five parameters of the single diode model.
2：Sample Selection and Data Sources:
Simulated IV curves for two representative PV modules (a 240 W, 60 cell cSi module and a 72 W, 114 cell CdTe module) are used, with parameters defined in Table I. Data is generated at various irradiance levels (400 to 1100 W/m2) and temperatures (25, 35, 45 °C).
3：List of Experimental Equipment and Materials:
No specific equipment is mentioned; simulations are performed using models (e.g., CEC model).
4：Experimental Procedures and Operational Workflow:
For each method, series resistance is estimated from simulated IV curves. The alternative method involves steps: determine diode factor from VOC vs. irradiance, estimate shunt resistance from linear fit, and iteratively solve for other parameters. Measurement error is simulated by adding noise to current values.
5：Data Analysis Methods:
Analytical derivations using Lambert W function are used to show systematic differences. Numerical comparisons are made between estimated and known series resistance values. Error analysis is performed with 100 Monte Carlo simulations for noise impact.
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