研究目的
To address the instability of GaAs photoanodes in aqueous media for solar-driven fuel synthesis by introducing a Ni-B surface catalyst to improve stability and photoelectrochemical performance.
研究成果
The in-situ deposition of Ni-B catalyst on GaAs photoanodes significantly improves stability and photocurrent, with the optimized structure achieving 20 mA/cm2 for 22 hours without decay. This approach addresses photocorrosion issues and shows potential for scalable solar fuel synthesis applications, though further work is needed to reduce voids and enhance efficiency.
研究不足
The Faradaic efficiency for O2 production is only 36%, indicating incomplete water oxidation due to voids in the Ni-B/Ga(As)Ox layer. The strategy may require further optimization to achieve higher efficiency and could be limited by light absorption and charge recombination in thicker layers.
1:Experimental Design and Method Selection:
The study used in-situ photoassisted electrodeposition of Ni-B onto p/n junction GaAs to form a Ni-B/Ga(As)Ox/GaAs structure, optimizing parameters like surface architecture, pH, and deposition time.
2:Sample Selection and Data Sources:
GaAs photoanodes were grown by molecular beam epitaxy on n-type GaAs substrates, with surface treatments (etching or polishing) to vary roughness.
3:List of Experimental Equipment and Materials:
Equipment included a Veeco Gen 930 molecular beam epitaxy system, Jeol JSM-7401F SEM, Thermo Scientific K-alpha XPS, Veeco Nanoscope AFM, Jordan Valley Bede D1 XRD, Newport 150 W xenon lamp, Ivium potentiostat, Varian 430-GC gas chromatograph. Materials included GaAs substrates, Ni, AuGe, epoxy, potassium borate, Ni(NO3)2, KOH, HCl, H3PO4, H2O
4:Experimental Procedures and Operational Workflow:
GaAs growth, surface pre-treatment, ohmic contact formation, Ni-B electrodeposition at
5:5 V vs Ag/AgCl under AM 5G light, PEC measurements in a three-electrode cell with Pt counter and Ag/AgCl reference electrodes in 1 M KOH, gas evolution analysis. Data Analysis Methods:
Photocurrent and dark current measurements, EIS for charge transfer resistance, XPS and SEM for material characterization, gas chromatography for Faradaic efficiency calculation using equations provided.
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Molecular Beam Epitaxy System
Veeco Gen 930
Veeco
Used for growing GaAs photoanodes by epitaxial growth.
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Scanning Electron Microscope
Jeol JSM-7401F
Jeol
Used for obtaining SEM images and EDS analysis.
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X-ray Photoelectron Spectrometer
Thermo Scientific K-alpha
Thermo Scientific
Used for high-resolution XPS measurements.
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Atomic Force Microscope
Veeco Nanoscope
Veeco
Used for AFM images of surface morphology.
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X-ray Diffractometer
Jordan Valley Bede D1
Jordan Valley
Used for XRD patterns.
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Xenon Lamp
150 W
Newport
Used as light source for illumination in PEC measurements.
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Potentiostat
Not specified
Ivium technology
Used for applying bias and recording currents in electrochemical measurements.
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Gas Chromatograph
Varian 430-GC
Varian
Used for analysis of gas evolved from electrodes.
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Optical Meter
1918-R
Newport
Used for calibrating light intensity.
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