研究目的
To prepare and characterize CdO:In2O3 thin films for gas sensor applications, investigating their structural, morphological, optical, electrical properties, and sensitivity to NO2 gas, with a focus on optimizing In2O3 concentration and operating temperature.
研究成果
CdO:In2O3 thin films exhibit polycrystalline nature with preferred orientation, n-type conductivity, and high sensitivity to NO2 gas, with optimal performance at 20 vol% In2O3 and 200°C operating temperature. The sensing mechanism involves electron transfer, making these films promising for gas sensor applications in optoelectronics.
研究不足
The study is limited to specific In2O3 concentrations and operating conditions; further optimization for other gases or environments may be needed. The sensitivity and selectivity might be affected by factors not fully explored, such as long-term stability or interference from other gases.
1：Experimental Design and Method Selection:
The study used a one-step spray pyrolysis technique to deposit polycrystalline CdO:In2O3 thin films on glass and silicon substrates at 300°C. The method was chosen for its simplicity and effectiveness in producing metal-oxide films.
2：Sample Selection and Data Sources:
Films were prepared with different In2O3 concentrations (10, 20, 30, 40 vol%) from aqueous solutions of CdCl2 and InCl
3：Substrates were glass and silicon. List of Experimental Equipment and Materials:
Equipment includes a spray pyrolysis setup with K-type thermocouple for temperature control, X-ray diffractometer (Shimadzu DIFRACTOMETER/6000), atomic force microscope (AA3000 Scanning Probe Microscope SPM), UV-visible spectrometer, Hall effect measurement system, digital multimeter (Rigol DM3062), and optical interferometer with He-Ne laser. Materials include CdCl2, InCl3, distilled water, glass and silicon substrates.
4：Experimental Procedures and Operational Workflow:
Solutions were prepared and sprayed with fixed parameters (nozzle-to-substrate distance 29 cm, spray time 5 s, interval 50 s). Films were characterized for structure (XRD), morphology (AFM), optical properties (UV-visible spectroscopy), electrical properties (Hall effect), and gas sensing (resistance measurements in NO2 atmosphere at various temperatures).
5：Data Analysis Methods:
XRD data analyzed for crystallinity and grain size using Debye-Scherrer formula, AFM for surface roughness, optical data for band gap using Tauc's relation, Hall effect for electrical parameters, and gas sensitivity calculated as Ra/Rg.
独家科研数据包，助您复现前沿成果，加速创新突破
获取完整内容
