研究目的
To study the effect of yttrium insertion on the structural, optical, vibrational, and dielectric properties of perovskite ceramics [Ba0.8Sr0.2]1-x[Bi1-yYy]xTi1-xFexO3 with x = 0.3 and 0.05 \ y \ 0.15.
研究成果
Yttrium insertion enhances the structural, optical, vibrational, and dielectric properties of the ceramics, leading to improved stability, increased band gap, reduced dielectric loss, and relaxor behavior, making them suitable for practical applications in optoelectronics.
研究不足
The study is limited to specific compositions and synthesis conditions; potential limitations include the use of solid-state reaction which may introduce impurities or inhomogeneities, and the focus on room temperature and specific frequency ranges without broader environmental or application testing.
1：Experimental Design and Method Selection:
The study uses solid-state reaction synthesis to prepare polycrystalline samples, followed by characterization using XRD, UV-Vis spectroscopy, Raman spectroscopy, and impedance spectroscopy to analyze structural, optical, vibrational, and dielectric properties. Theoretical models include the Debye-Scherrer relation for crystallite size and Curie-Weiss law for dielectric behavior.
2：Sample Selection and Data Sources:
Samples are synthesized with specific compositions (x=0.3, y=0.05, 0.1, 0.15) using high-purity reagents (BaCO3, SrCO3, Bi2O3, TiO2, Fe2O3, Y2O3 from Aldrich). Data are collected from experimental measurements.
3：3, y=05, 1, 15) using high-purity reagents (BaCO3, SrCO3, Bi2O3, TiO2, Fe2O3, Y2O3 from Aldrich). Data are collected from experimental measurements.
List of Experimental Equipment and Materials:
3. List of Experimental Equipment and Materials: Equipment includes a Panalytical X'PERT Pro diffractometer for XRD, Shimadzu UV-3101 PC spectrophotometer for UV-Vis, LabRam HR800 spectrophotometer for Raman spectroscopy, and Agilent 4294A impedance analyzer for dielectric measurements. Materials include the ceramic samples and BaSO4 as a standard.
4：Experimental Procedures and Operational Workflow:
Precursors are ground, calcined at 770°C for 3h, reground, pelletized, and sintered at 970°C for 3h. XRD is performed with CuKα radiation, UV-Vis with an integration sphere, Raman with a 633 nm laser, and dielectric measurements from 40 Hz to 110 MHz.
5：3h. XRD is performed with CuKα radiation, UV-Vis with an integration sphere, Raman with a 633 nm laser, and dielectric measurements from 40 Hz to 110 MHz.
Data Analysis Methods:
5. Data Analysis Methods: XRD data are refined using Fullprof software, band gap is determined from UV-Vis plots, Raman modes are deconvoluted using LabSpec5 software, and dielectric data are analyzed using modulus and Curie-Weiss law.
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