研究目的
Investigating the fabrication and performance of conductive films with tri-layer sandwich structures based on carbon nanotubes and silver nanowires for use as stretchable interconnects in electronic devices.
研究成果
The tri-layer conductive films, particularly CNT-sAgNW-CNT with enhanced interfacial interactions, exhibit high stretchability (>250% strain), insignificant piezoresistivity, and excellent durability under repetitive deformations, making them suitable for stretchable interconnects in wearable electronics. Surface modification with benzyl mercaptan improves stability, and the fabrication method is effective for creating robust stretchable conductors.
研究不足
The conductive films are opaque due to high thickness and deposition density, limiting transparency. Surface modification and encapsulation processes may introduce variability. The study focuses on specific nanomaterials and may not generalize to other materials or larger-scale applications.
1：Experimental Design and Method Selection:
The study used a successive vacuum filtration method to fabricate tri-layer conductive films with different stacking sequences (AgNW-CNT-AgNW, CNT-AgNW-CNT, CNT-sAgNW-CNT) and encapsulated them in silicone rubber to create stretchable interconnects. Surface modification of AgNWs with benzyl mercaptan was employed to enhance interfacial interactions.
2：Sample Selection and Data Sources:
Silver nanowires (AgNWs) and multi-walled carbon nanotubes (CNTs) were purchased from suppliers. Samples were prepared as strip interconnects for testing.
3：List of Experimental Equipment and Materials:
Materials included AgNWs (diameter 90 ± 20 nm, length 30 μm, 1 wt.% in IPA from Blue Nano Inc.), CNTs (diameter 65 ± 25 nm, length >10 μm from Golden Innovation Business Co.), benzyl mercaptan (99% from Alfa Aesar), SDS surfactant (99% from Acros), silicone rubber (SCT-4023-1 from Tennitech Inc.), PVDF membrane filters (pore size
4：45 μm from Chrom Tech Inc.), and various instruments for characterization and measurement. Experimental Procedures and Operational Workflow:
Conductive films were deposited via vacuum filtration, transferred to silicone rubber substrates, encapsulated, and wired with copper foil and silver paste. Electrical resistance was measured during cyclic stretching and bending tests using a two-probe method with a digital multimeter. Characterization included SEM, TEM, XRD, XPS, Raman spectroscopy, and optical microscopy.
5：Data Analysis Methods:
Sheet resistance and electrical conductivity were calculated from measurements. XPS data were deconvoluted using Gaussian-Lorentzian functions. Resistance changes were analyzed as a function of strain and cycle times.
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X-ray Diffractometer
AXS Gmbh
Bruker
Used to analyze the crystalline structure of nanomaterials.
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Transmission Electron Microscope
JEM-1400
JEOL
Used to obtain micrographs of silver nanowires.
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Raman Spectrophotometer
Ventuno-21
Jasco
Used to examine surface modifications via Raman spectroscopy.
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Field Emission Scanning Electron Microscope
JSM-6700
JEOL
Used to investigate surface morphology of conductive films.
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Optical Microscope
Leica DMLM
Leica
Used to observe surface morphology at low magnification.
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Digital Multimeter
Keithley 2000
Keithley
Used to measure electrical resistance and power LED demonstrations.
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Bath-type Sonicator
DC200H
Delta
Used for sonicating and dispersing sAgNW suspensions.
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Silver Nanowires
diameter 90 ± 20 nm, length 30 μm
Blue Nano Inc.
Used as a conductive component in the hybrid films for stretchable interconnects.
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Multi-walled Carbon Nanotubes
diameter 65 ± 25 nm, length >10 μm
Golden Innovation Business Co.
Used as a conductive component in the hybrid films for stretchable interconnects.
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Benzyl Mercaptan
99%
Alfa Aesar
Used for surface modification of AgNWs to enhance interfacial interactions.
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Sodium Dodecyl Sulfate
99%
Acros
Used as a surfactant in the preparation of CNT suspensions.
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Silicone Rubber
SCT-4023-1
Tennitech Inc.
Used as the stretchable substrate for encapsulating the conductive films.
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PVDF Membrane Filter
pore size 0.45 μm, diameter 90 mm
Chrom Tech Inc.
Used in the vacuum filtration method to deposit conductive films.
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XPS Instrument
PHI 5000 VersaProbe
ULVAC-PHI
Used for X-ray photoelectron spectroscopy to identify atomic elements.
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Four-point Probe Unit
RT-7
Napson
Used in conjunction with multimeter for sheet resistance measurements.
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Motorized Translation Stage
Unice E-O
Unice
Used for cyclic stretching and bending tests.
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Probe-type Sonicator
Q125
QSonia
Used for dispersing CNT powders in aqueous solution.
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