1：Experimental Design and Method Selection:

The study involved forming Langmuir monolayers (LM) of unsymmetrical bent-core liquid crystal (BCLC) molecules (BN1 and BN2) at the air–water interface using a Langmuir–Blodgett (LB) trough. The LM was compressed symmetrically, and surface pressure–area isotherms were recorded. Real-time imaging of the LM was performed using Brewster angle microscopy (BAM). LB films were transferred onto solid substrates (Si/SiO2 and ITO-coated glass) at different target surface pressures. The morphology of LB films was characterized using field emission scanning electron microscopy (FESEM), atomic force microscopy (AFM), and X-ray diffraction (XRD). Adhesion forces were measured using AFM with chemically modified tips. LC cells were fabricated using LB films as alignment layers, and the alignment of nematic liquid crystal (E7) was observed under a polarizing optical microscope (POM).

2：Sample Selection and Data Sources:

The BCLC molecules BN1 (C48H49NO11) and BN2 (C52H57NO11) were synthesized in the laboratory. Solutions were prepared in chloroform (HPLC grade) and spread onto ion-free water subphase. Substrates included Si/SiO2 and ITO-coated glass, cleaned with piranha solution and solvents.

3：List of Experimental Equipment and Materials:

LB trough (Apex Instruments, India), BAM (miniBAM, Nanofilm Technologie, Germany), FESEM (ZEISS, Sigma), AFM (NT-MDT, Solver Pro), XRD (PAN Alytical XPERT-PRO), POM (Olympus BX51), digital camera, chemicals (chloroform, H2SO4, H2O2, alcohol, acetone, HMDS), substrates (Si/SiO2, ITO-coated glass), NLC (E7 from Merck).

4：Experimental Procedures and Operational Workflow:

LM formation by spreading BCLC solutions on water subphase, compression at 20 mm/min, isotherm recording, BAM imaging. LB film deposition at target surface pressures (2, 10, 20 mN/m) with upstroke motion at 5 mm/min. Morphology analysis using FESEM, AFM, and XRD. Adhesion force measurement with AFM. LC cell fabrication with 8 μm gap, filling with E7 NLC, and POM observation.

5：Data Analysis Methods:

Isotherm analysis for in-plane elastic modulus, AFM image analysis using WSxM software, XRD for d-spacing calculation, POM for alignment characterization.