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oe1(光电查) - 科学论文

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?? 中文(中国)
  • P-1.11: A Compact Model of Current and Capacitance for Amorphous Indium Gallium Zinc Oxide Thin-Film Transistors

    摘要: In recent years, amorphous indium gallium zinc oxide (a-IGZO) thin-film transistors (TFTs) have shown outstanding performance in flexible circuit applications, active matrix display and so on. Therefore, they will play an increasingly important role in the future of electronic applications. At the same time, an analytical model that predicts the electrical characteristics of IGZO TFTs is also critical. In this paper, we present a current and capacitance compact model of a-IGZO TFTs. The compact model can be applied to different channel lengths for a-IGZO TFTs. Besides, it is capable of capturing device characteristics and of maintaining high computational efficiency. Its accuracy is validated through the extensive comparisons between model results and experimental data.

    关键词: degenerate mechanism,AC model,Amorphous IGZO thin-film transistors,DC model

    更新于2025-09-04 15:30:14